Scanning force microscopy : with applications to electric, magnetic, and atomic forces / Dror Sarid.

By: Sarid, Dror .

Material type: materialTypeLabel

BookSeries: Oxford series in optical and imaging sciences: 2.Publisher: New York : Oxford University Press, 1991Description: xi, 253 p. : ill. ; 25 cm.ISBN: 0195062701.Subject(s): Scanning force microscopy

| Surfaces (Physics)

DDC classification: 502.82

Contents:

Part one. Levers and noise -- Mechanical properties of levers -- Resonance enhancement -- Sources of noise -- Part two: Scanning force microscopes -- Tunneling detection system -- Capacitance detection system -- Homodyne detection system -- Heterodyne detection system -- Laser-diode feedback detection system -- Polarization detection system -- Deflection detection system -- Part three: Scanning force microscopy -- Electric force microscopy -- Magnetic force microscopy -- Atomic force microscopy.

Holdings
Item type	Current library	Call number	Copy number	Status	Date due	Barcode	Item holds
General Lending	MTU Bishopstown Library Lending	502.82 (Browse shelf(Opens below))	1	Available		00019571

Total holds: 0

Enhanced descriptions from Syndetics:

Scanning tunneling microscopy (STM), invented by Binnig and Rohrer in 1982, enables one to obtain images reflecting surface electronic structure with atomic resolution. As an offshoot of this technology, Binnig, Quate and Gerber in 1986 invented atomic force microscopy (AFM), also capable of achieving atomic resolution. By now this technology proved to be an indispensable characterization tool with applications to surface physics and chemistry, material science, bio-science and data storage media, with promise in such areas as the semiconductor industry and optical quality control, for example. This book is the first attempt at organizing the whole rainbow of rapidly developing topics dealing with the mapping of a variety of forces across surfaces. Academic and industrial researchers using STM, or wishing to know more about its potential, will find this book a valuable source of up-to-date information.

Includes bibliographical references (pages 233-259) and index..

Table of contents provided by Syndetics

Preface to the Revised Edition (p. vii)
Preface (p. ix)
Part 1 Levers and Noise
Chapter 1 Mechanical Properties of Levers (p. 1)
1.1. Introduction (p. 1)
1.2. Stress and Strain (p. 2)
1.3. Moments (p. 4)
1.4. Spring Constant (p. 5)
1.5. The Rayleigh Solution to a Vibrating Lever (p. 7)
1.6. The Classical Solution to a Vibrating Lever (p. 9)
1.7. Normal Modes (p. 10)
1.8. Lumped Systems (p. 12)
1.9. Examples (p. 13)
1.10. Summary (p. 17)
Chapter 2 Resonance Enhancement (p. 19)
2.1. Introduction (p. 19)
2.2. Bimorph Driver (p. 19)
2.3. Effective Spring Constant (p. 21)
2.4. Bimorph-Driven Lever (p. 22)
2.5. Sample-Driven Lever (p. 32)
2.6. Tip-Driven Lever (p. 35)
2.7. Summary (p. 37)
Chapter 3 Sources of Noise (p. 39)
3.1. Introduction (p. 39)
3.2. General Discussion of Noise (p. 39)
3.3. Shot Noise (p. 41)
3.4. Resistor Johnson Noise (p. 42)
3.5. Laser Intensity Noise (p. 42)
3.6 Laser Phase Noise (p. 43)
3.7. Thermally Induced Lever Noise (p. 46)
3.8. Bimorph Noise (p. 49)
3.9. Lever Noise-Limited SNR (p. 49)
3.10. Experimental Characterization of Noise (p. 50)
3.11. Summary (p. 53)
Part 2 Scanning Force Microscopes
Chapter 4 Tunneling Detection System (p. 55)
4.1. Introduction (p. 55)
4.2. Theory (p. 55)
4.3. Perpendicular Arrangement (p. 57)
4.4. Cross Arrangement (p. 64)
4.5. Parallel Arrangement (p. 64)
4.6. Serial Arrangement (p. 64)
4.7. Single-Lever Arrangement (p. 64)
4.8. Summary (p. 64)
Chapter 5 Capacitance Detection System (p. 65)
5.1. Introduction (p. 65)
5.2. Theory (p. 66)
5.3. Noise Considerations (p. 68)
5.4. Performance of Systems (p. 69)
5.5. Summary (p. 73)
Chapter 6 Homodyne Detection System (p. 75)
6.1. Introduction (p. 75)
6.2. Theory (p. 76)
6.3. Noise Considerations (p. 81)
6.4. System Performance (p. 84)
6.5. Summary (p. 89)
Chapter 7 Heterodyne Detection System (p. 91)
7.1. Introduction (p. 91)
7.2. Theory (p. 92)
7.3. Noise Considerations (p. 95)
7.4. Performance (p. 96)
7.5. Summary (p. 99)
Chapter 8 Laser-Diode Feedback Detection System (p. 101)
8.1. Introduction (p. 101)
8.2. Theory (p. 102)
8.3. Noise Considerations (p. 105)
8.4. Performance (p. 107)
8.5. Summary (p. 108)
Chapter 9 Polarization Detection System (p. 109)
9.1. Introduction (p. 109)
9.2. Theory (p. 109)
9.3. Noise Considerations (p. 113)
9.4. Performance (p. 116)
9.5. Summary (p. 117)
Chapter 10 Deflection Detection System (p. 119)
10.1. Introduction (p. 119)
10.2. Theory (p. 120)
10.3. Noise Considerations (p. 122)
10.4. Performance (p. 125)
10.5. Summary (p. 128)
Part 3 Scanning Force Microscopy
Chapter 11 Electric Force Microscopy (p. 129)
11.1. Introduction (p. 129)
11.2. Basic Concepts (p. 129)
11.3. Examples (p. 131)
11.4. Principles of Operation (p. 137)
11.5. Noise Considerations (p. 145)
11.6. Applications (p. 146)
11.7. Performance (p. 148)
11.8. Summary (p. 151)
Chapter 12 Magnetic Force Microscopy (p. 153)
12.1. Introduction (p. 153)
12.2. Basic Concepts (p. 153)
12.3. Examples (p. 156)
12.4. Principles of Operation (p. 167)
12.5. Noise Considerations (p. 173)
12.6. Applications (p. 174)
12.7. Performance (p. 174)
12.8. Summary (p. 180)
Chapter 13 Atomic Force Microscopy (p. 181)
13.1. Introduction (p. 181)
13.2. Intermolecular Microscopic Interactions (p. 182)
13.3. Intermolecular Macroscopic Interactions (p. 189)
13.4. Lever-Tip-Sample Contact Interactions (p. 197)
13.5. Lever-Tip-Sample Noncontact Interactions (p. 210)
13.6. Experimental Results for the Contact Mode (p. 218)
References (p. 233)
Index (p. 261)

Scanning force microscopy : with applications to electric, magnetic, and atomic forces / Dror Sarid.

By: Sarid, Dror.

Enhanced descriptions from Syndetics:

Table of contents provided by Syndetics

By: Sarid, Dror .