MARC details
000 -LEADER |
fixed length control field |
01573 am a2200337 a 4500 |
001 - CONTROL NUMBER |
control field |
ocm0195062701 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
IE-CoMTU |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20230202134700.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
901023s1991 xxua rb 001 eng |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
90021467 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0195062701 |
029 ## - OTHER SYSTEM CONTROL NUMBER (OCLC) |
OCLC library identifier |
T11922 |
040 ## - CATALOGING SOURCE |
Modifying agency |
OCoLC |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
502.82 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Sarid, Dror. |
9 (RLIN) |
20530 |
245 10 - TITLE STATEMENT |
Title |
Scanning force microscopy : |
Remainder of title |
with applications to electric, magnetic, and atomic forces / |
Statement of responsibility, etc. |
Dror Sarid. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New York : |
Name of publisher, distributor, etc. |
Oxford University Press, |
Date of publication, distribution, etc. |
1991. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xi, 253 p. : |
Other physical details |
ill. ; |
Dimensions |
25 cm. |
490 1# - SERIES STATEMENT |
Series statement |
Oxford series on optical sciences ; |
Volume/sequential designation |
2 |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references (pages 233-259) and index.. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Part one. Levers and noise -- Mechanical properties of levers -- Resonance enhancement -- Sources of noise -- Part two: Scanning force microscopes -- Tunneling detection system -- Capacitance detection system -- Homodyne detection system -- Heterodyne detection system -- Laser-diode feedback detection system -- Polarization detection system -- Deflection detection system -- Part three: Scanning force microscopy -- Electric force microscopy -- Magnetic force microscopy -- Atomic force microscopy. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Scanning force microscopy. |
9 (RLIN) |
45339 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Surfaces (Physics) |
9 (RLIN) |
43085 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
Oxford series in optical and imaging sciences ; |
Volume/sequential designation |
2. |
9 (RLIN) |
30676 |
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
a |
.b10159150 |
b |
150615 |
c |
011116 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Suppress in OPAC |
0 |
Source of classification or shelving scheme |
Dewey Decimal Classification |
969 00 - LOCAL CODES |
a |
267 |
979 00 - LOCAL CODES |
a |
OB2 |
b |
30 OCT 2001 |
989 00 - LOCAL CODES |
a |
OB2 |
998 ## - LOCAL CONTROL INFORMATION (RLIN) |
a |
c |
Operator's initials, OID (RLIN) |
011115 |
Cataloger's initials, CIN (RLIN) |
m |
First Date, FD (RLIN) |
a |
Local |
- |
-- |
eng |
-- |
nyu |
h |
0 |