Scanning force microscopy : with applications to electric, magnetic, and atomic forces /
Sarid, Dror.
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / Dror Sarid. - New York : Oxford University Press, 1991. - xi, 253 p. : ill. ; 25 cm. - Oxford series on optical sciences ; 2 . - Oxford series in optical and imaging sciences ; 2. .
Includes bibliographical references (pages 233-259) and index..
Part one. Levers and noise -- Mechanical properties of levers -- Resonance enhancement -- Sources of noise -- Part two: Scanning force microscopes -- Tunneling detection system -- Capacitance detection system -- Homodyne detection system -- Heterodyne detection system -- Laser-diode feedback detection system -- Polarization detection system -- Deflection detection system -- Part three: Scanning force microscopy -- Electric force microscopy -- Magnetic force microscopy -- Atomic force microscopy.
0195062701
90021467
Scanning force microscopy.
Surfaces (Physics)
502.82
Scanning force microscopy : with applications to electric, magnetic, and atomic forces / Dror Sarid. - New York : Oxford University Press, 1991. - xi, 253 p. : ill. ; 25 cm. - Oxford series on optical sciences ; 2 . - Oxford series in optical and imaging sciences ; 2. .
Includes bibliographical references (pages 233-259) and index..
Part one. Levers and noise -- Mechanical properties of levers -- Resonance enhancement -- Sources of noise -- Part two: Scanning force microscopes -- Tunneling detection system -- Capacitance detection system -- Homodyne detection system -- Heterodyne detection system -- Laser-diode feedback detection system -- Polarization detection system -- Deflection detection system -- Part three: Scanning force microscopy -- Electric force microscopy -- Magnetic force microscopy -- Atomic force microscopy.
0195062701
90021467
Scanning force microscopy.
Surfaces (Physics)
502.82