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Particles on surfaces : detection, adhesion, and removal / edited by K. L. Mittal.

By: (4th : Symposium on Particles on Surfaces: Detection, Adhesion, and Removal (4th : 1992 : Las Vegas, Nev.).
Contributor(s): Mittal, K. L, 1945- | Fine Particle Society (23rd : 1992 : Las Vegas, Nev.).
Material type: materialTypeLabelBookPublisher: New York : M. Dekker, 1995Description: xii, 422 p. : ill. ; 24 cm.ISBN: 0824795350.Subject(s): Particles -- Congresses | Surfaces (Technology) -- CongressesDDC classification: 620.43
Contents:
Particles on surfaces: adhesion induced deformations / D. S. Rimai, L. P. DeMejo, R. Bowen and J. D. Morris -- Surface force tensile interactions between micrometer size particles and a polyester - PDMS block copolymer substrate / L. P. DeMejo, D. S. Rimai, J. H. Chen and R. Bowen -- Polymer to particle adhesion probed with atomic force microscopy / H. Mizes, K. -G Loh, M. J. Ott and R. J. D. Miller -- Surface particle contamination identification in microelectronics / M. Simard-Normandin -- An overview of spacecraft particulate contamination phenomena / M. C. Fong, A. L. Lee and P. T. Ma -- Contamination on optical surfaces - concerns, prevention, detection and removal / J. M. Bennett -- An advanced surface particle and molecular contaminant identification, removal, and collection system / S. P. Hotaling and D. A. Dykeman -- The role of air ionization in reducing surface contamination by particles in the cleanroom / S. Gehlke and A. J. Steinman -- Selecting a contamination-free deburring process: testing abrasive blasting media / W. L. Prater, G. J. Stone and G. J. Chung -- Particle generation and control in tubing and piping connection design / M. Alberg -- Detection and identification of particles on silicon surfaces / T. Hattori -- The characterization of particles on spacecraft returned from orbit / E. R. Crutcher -- A light-scattering method for determining the composition of particles on surfaces / L. D. Lamb, J. D. Lorentzen and D. R. Huffman -- Light scattering by spherical particles on planar multi-layered substrates / A. Cangellaris and F. I. Assi -- New test procedure for the examination of the particulate cleanliness of technical surfaces / H. -J. Warnecke and B. Klumpp -- Discrimination between particulate and film type contamination on surfaces by means of total reflection x-ray fluorescence spectrometry / H. Schwenke and J. Knoth -- Particle characterization on surfaces by auger electron spectroscopy / W. F. Stickle, D. Paul and L. A. LaVanier -- Interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves / G. J. Breteton and B. A. Bruno -- Removal of glass particles from glass surfaces: a review / A. Ghosh and W. P. Ryszytiwskyj -- Particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement / R. Nagarajan -- Fluid dynamics of liquid jets used for particle removal from surfaces / R. Gim, T. Lesniewski and S. Middleman -- Enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions / R. Kaiser -- Laser cleaning techniques for the removal of small surface particulates / A. C. Tam, W. P. Leung and W. Zapka.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Lending 620.43 (Browse shelf(Opens below)) 1 Available 00018321
Total holds: 0

Enhanced descriptions from Syndetics:

This work comprises the proceedings of the Fourth Symposium on Particles on Surfaces. Papers cover: adhesion-induced deformations of particles on surfaces; the use of atomic force microscopy in probing particle-particle adhesion; particle contamination in microelectronics, on spacecraft, and on optical surfaces; the role of air ionization in reducing surface contamination by particles in the cleanroom; abrasive blasting media for contamination-free deburring processes; and more.;The book is intended for physical, chemical, surface and colloid chemists, materials scientists; polymers, plastics, electrical and electronics, computer, chemical and mechanical engineers; and upper-level undergraduate and graduate students in these disciplines.

"Proceedings of the Fourth Symposium on Particles on Surfaces: Detection, Adhesion, and Removal, held as part of the Twenty-third Annual Meeting of the Fine Particle Society, July 13-17, 1992, in San Diego, California"

Includes bibliographical references and index.

Particles on surfaces: adhesion induced deformations / D. S. Rimai, L. P. DeMejo, R. Bowen and J. D. Morris -- Surface force tensile interactions between micrometer size particles and a polyester - PDMS block copolymer substrate / L. P. DeMejo, D. S. Rimai, J. H. Chen and R. Bowen -- Polymer to particle adhesion probed with atomic force microscopy / H. Mizes, K. -G Loh, M. J. Ott and R. J. D. Miller -- Surface particle contamination identification in microelectronics / M. Simard-Normandin -- An overview of spacecraft particulate contamination phenomena / M. C. Fong, A. L. Lee and P. T. Ma -- Contamination on optical surfaces - concerns, prevention, detection and removal / J. M. Bennett -- An advanced surface particle and molecular contaminant identification, removal, and collection system / S. P. Hotaling and D. A. Dykeman -- The role of air ionization in reducing surface contamination by particles in the cleanroom / S. Gehlke and A. J. Steinman -- Selecting a contamination-free deburring process: testing abrasive blasting media / W. L. Prater, G. J. Stone and G. J. Chung -- Particle generation and control in tubing and piping connection design / M. Alberg -- Detection and identification of particles on silicon surfaces / T. Hattori -- The characterization of particles on spacecraft returned from orbit / E. R. Crutcher -- A light-scattering method for determining the composition of particles on surfaces / L. D. Lamb, J. D. Lorentzen and D. R. Huffman -- Light scattering by spherical particles on planar multi-layered substrates / A. Cangellaris and F. I. Assi -- New test procedure for the examination of the particulate cleanliness of technical surfaces / H. -J. Warnecke and B. Klumpp -- Discrimination between particulate and film type contamination on surfaces by means of total reflection x-ray fluorescence spectrometry / H. Schwenke and J. Knoth -- Particle characterization on surfaces by auger electron spectroscopy / W. F. Stickle, D. Paul and L. A. LaVanier -- Interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves / G. J. Breteton and B. A. Bruno -- Removal of glass particles from glass surfaces: a review / A. Ghosh and W. P. Ryszytiwskyj -- Particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement / R. Nagarajan -- Fluid dynamics of liquid jets used for particle removal from surfaces / R. Gim, T. Lesniewski and S. Middleman -- Enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions / R. Kaiser -- Laser cleaning techniques for the removal of small surface particulates / A. C. Tam, W. P. Leung and W. Zapka.

Table of contents provided by Syndetics

  • Preface (p. iii)
  • Particles on Surfaces: Adhesion Induced Deformations (p. 1)
  • Surface Force Tensile Interactions Between Micrometer Size Particles and a Polyester-PDMS Block Copolymer Substrate (p. 33)
  • Polymer to Particle Adhesion Probed with Atomic Force Microscopy (p. 47)
  • Surface Particle Contamination Identification in Microelectronics (p. 61)
  • An Overview of Spacecraft Particulate Contamination Phenomena (p. 77)
  • Contamination on Optical Surfaces--Concerns, Prevention, Detection, and Removal (p. 101)
  • An Advanced Surface Particle and Molecular Contaminant Identification, Removal, and Collection System (p. 111)
  • The Role of Air Ionization in Reducing Surface Contamination by Particles in the Cleanroom (p. 141)
  • Selecting a Contamination-Free Deburring Process: Testing Abrasive Blasting Media (p. 151)
  • Particle Generation and Control in Tubing and Piping Connection Design (p. 189)
  • Detection and Identification of Particles on Silicon Surfaces (p. 201)
  • The Characterization of Particles on Spacecraft Returned from Orbit (p. 219)
  • A Light-Scattering Method for Determining the Composition of Particles on Surfaces (p. 253)
  • Light Scattering by Spherical Particles on Planar Multi-Layered Substrates (p. 265)
  • New Test Procedure for the Examination of the Particulate Cleanliness of Technical Surfaces (p. 289)
  • Discrimination Between Particulate and Film Type Contamination on Surfaces by Means of Total Reflection X-Ray Fluorescence Spectrometry (p. 311)
  • Particle Characterization on Surfaces by Auger Electron Spectroscopy (p. 325)
  • Interrogating the Behavior of Micrometer-Sized Particles on Surfaces with Focused Acoustic Waves (p. 335)
  • Removal of Glass Particles from Glass Surfaces: A Review (p. 353)
  • Particle Removal Characteristics of Surface Cleaning Methods Involving Sonication and/or Spray Impingement (p. 363)
  • Fluid Dynamics of Liquid Jets Used for Particle Removal from Surfaces (p. 379)
  • Enhanced Particle Removal from Inertial Guidance Instrument Parts by Fluorocarbon Surfactant Solutions (p. 395)
  • Laser Cleaning Techniques for the Removal of Small Surface Particulates (p. 405)
  • Index (p. 419)

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