Particles on surfaces : detection, adhesion, and removal /
Particles on surfaces : detection, adhesion, and removal /
edited by K. L. Mittal.
- New York : M. Dekker, 1995.
- xii, 422 p. : ill. ; 24 cm.
"Proceedings of the Fourth Symposium on Particles on Surfaces: Detection, Adhesion, and Removal, held as part of the Twenty-third Annual Meeting of the Fine Particle Society, July 13-17, 1992, in San Diego, California"
Includes bibliographical references and index.
Particles on surfaces: adhesion induced deformations / D. S. Rimai, L. P. DeMejo, R. Bowen and J. D. Morris -- Surface force tensile interactions between micrometer size particles and a polyester - PDMS block copolymer substrate / L. P. DeMejo, D. S. Rimai, J. H. Chen and R. Bowen -- Polymer to particle adhesion probed with atomic force microscopy / H. Mizes, K. -G Loh, M. J. Ott and R. J. D. Miller -- Surface particle contamination identification in microelectronics / M. Simard-Normandin -- An overview of spacecraft particulate contamination phenomena / M. C. Fong, A. L. Lee and P. T. Ma -- Contamination on optical surfaces - concerns, prevention, detection and removal / J. M. Bennett -- An advanced surface particle and molecular contaminant identification, removal, and collection system / S. P. Hotaling and D. A. Dykeman -- The role of air ionization in reducing surface contamination by particles in the cleanroom / S. Gehlke and A. J. Steinman -- Selecting a contamination-free deburring process: testing abrasive blasting media / W. L. Prater, G. J. Stone and G. J. Chung -- Particle generation and control in tubing and piping connection design / M. Alberg -- Detection and identification of particles on silicon surfaces / T. Hattori -- The characterization of particles on spacecraft returned from orbit / E. R. Crutcher -- A light-scattering method for determining the composition of particles on surfaces / L. D. Lamb, J. D. Lorentzen and D. R. Huffman -- Light scattering by spherical particles on planar multi-layered substrates / A. Cangellaris and F. I. Assi -- New test procedure for the examination of the particulate cleanliness of technical surfaces / H. -J. Warnecke and B. Klumpp -- Discrimination between particulate and film type contamination on surfaces by means of total reflection x-ray fluorescence spectrometry / H. Schwenke and J. Knoth -- Particle characterization on surfaces by auger electron spectroscopy / W. F. Stickle, D. Paul and L. A. LaVanier -- Interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves / G. J. Breteton and B. A. Bruno -- Removal of glass particles from glass surfaces: a review / A. Ghosh and W. P. Ryszytiwskyj -- Particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement / R. Nagarajan -- Fluid dynamics of liquid jets used for particle removal from surfaces / R. Gim, T. Lesniewski and S. Middleman -- Enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions / R. Kaiser -- Laser cleaning techniques for the removal of small surface particulates / A. C. Tam, W. P. Leung and W. Zapka.
0824795350
95200297
Particles--Congresses.
Surfaces (Technology)--Congresses
620.43
"Proceedings of the Fourth Symposium on Particles on Surfaces: Detection, Adhesion, and Removal, held as part of the Twenty-third Annual Meeting of the Fine Particle Society, July 13-17, 1992, in San Diego, California"
Includes bibliographical references and index.
Particles on surfaces: adhesion induced deformations / D. S. Rimai, L. P. DeMejo, R. Bowen and J. D. Morris -- Surface force tensile interactions between micrometer size particles and a polyester - PDMS block copolymer substrate / L. P. DeMejo, D. S. Rimai, J. H. Chen and R. Bowen -- Polymer to particle adhesion probed with atomic force microscopy / H. Mizes, K. -G Loh, M. J. Ott and R. J. D. Miller -- Surface particle contamination identification in microelectronics / M. Simard-Normandin -- An overview of spacecraft particulate contamination phenomena / M. C. Fong, A. L. Lee and P. T. Ma -- Contamination on optical surfaces - concerns, prevention, detection and removal / J. M. Bennett -- An advanced surface particle and molecular contaminant identification, removal, and collection system / S. P. Hotaling and D. A. Dykeman -- The role of air ionization in reducing surface contamination by particles in the cleanroom / S. Gehlke and A. J. Steinman -- Selecting a contamination-free deburring process: testing abrasive blasting media / W. L. Prater, G. J. Stone and G. J. Chung -- Particle generation and control in tubing and piping connection design / M. Alberg -- Detection and identification of particles on silicon surfaces / T. Hattori -- The characterization of particles on spacecraft returned from orbit / E. R. Crutcher -- A light-scattering method for determining the composition of particles on surfaces / L. D. Lamb, J. D. Lorentzen and D. R. Huffman -- Light scattering by spherical particles on planar multi-layered substrates / A. Cangellaris and F. I. Assi -- New test procedure for the examination of the particulate cleanliness of technical surfaces / H. -J. Warnecke and B. Klumpp -- Discrimination between particulate and film type contamination on surfaces by means of total reflection x-ray fluorescence spectrometry / H. Schwenke and J. Knoth -- Particle characterization on surfaces by auger electron spectroscopy / W. F. Stickle, D. Paul and L. A. LaVanier -- Interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves / G. J. Breteton and B. A. Bruno -- Removal of glass particles from glass surfaces: a review / A. Ghosh and W. P. Ryszytiwskyj -- Particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement / R. Nagarajan -- Fluid dynamics of liquid jets used for particle removal from surfaces / R. Gim, T. Lesniewski and S. Middleman -- Enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions / R. Kaiser -- Laser cleaning techniques for the removal of small surface particulates / A. C. Tam, W. P. Leung and W. Zapka.
0824795350
95200297
Particles--Congresses.
Surfaces (Technology)--Congresses
620.43