MARC details
| 000 -LEADER |
|---|
| fixed length control field |
03993 am a22003255a 4500 |
| 001 - CONTROL NUMBER |
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| control field |
ocm0824795350 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
950906s1995 xxua r 000 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
95200297 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
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| International Standard Book Number |
0824795350 |
| 029 ## - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
T15229 |
| 040 ## - CATALOGING SOURCE |
|---|
| Modifying agency |
OCoLC |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.43 |
| 111 2# - MAIN ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Symposium on Particles on Surfaces: Detection, Adhesion, and Removal |
| Number of part/section/meeting |
(4th : |
| Date of meeting |
1992 : |
| Location of meeting |
Las Vegas, Nev.) |
| 245 00 - TITLE STATEMENT |
|---|
| Title |
Particles on surfaces : |
| Remainder of title |
detection, adhesion, and removal / |
| Statement of responsibility, etc. |
edited by K. L. Mittal. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
New York : |
| Name of publisher, distributor, etc. |
M. Dekker, |
| Date of publication, distribution, etc. |
1995. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
xii, 422 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. |
| 500 ## - GENERAL NOTE |
|---|
| General note |
"Proceedings of the Fourth Symposium on Particles on Surfaces: Detection, Adhesion, and Removal, held as part of the Twenty-third Annual Meeting of the Fine Particle Society, July 13-17, 1992, in San Diego, California" |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 505 0# - FORMATTED CONTENTS NOTE |
|---|
| Formatted contents note |
Particles on surfaces: adhesion induced deformations / D. S. Rimai, L. P. DeMejo, R. Bowen and J. D. Morris -- Surface force tensile interactions between micrometer size particles and a polyester - PDMS block copolymer substrate / L. P. DeMejo, D. S. Rimai, J. H. Chen and R. Bowen -- Polymer to particle adhesion probed with atomic force microscopy / H. Mizes, K. -G Loh, M. J. Ott and R. J. D. Miller -- Surface particle contamination identification in microelectronics / M. Simard-Normandin -- An overview of spacecraft particulate contamination phenomena / M. C. Fong, A. L. Lee and P. T. Ma -- Contamination on optical surfaces - concerns, prevention, detection and removal / J. M. Bennett -- An advanced surface particle and molecular contaminant identification, removal, and collection system / S. P. Hotaling and D. A. Dykeman -- The role of air ionization in reducing surface contamination by particles in the cleanroom / S. Gehlke and A. J. Steinman -- Selecting a contamination-free deburring process: testing abrasive blasting media / W. L. Prater, G. J. Stone and G. J. Chung -- Particle generation and control in tubing and piping connection design / M. Alberg -- Detection and identification of particles on silicon surfaces / T. Hattori -- The characterization of particles on spacecraft returned from orbit / E. R. Crutcher -- A light-scattering method for determining the composition of particles on surfaces / L. D. Lamb, J. D. Lorentzen and D. R. Huffman -- Light scattering by spherical particles on planar multi-layered substrates / A. Cangellaris and F. I. Assi -- New test procedure for the examination of the particulate cleanliness of technical surfaces / H. -J. Warnecke and B. Klumpp -- Discrimination between particulate and film type contamination on surfaces by means of total reflection x-ray fluorescence spectrometry / H. Schwenke and J. Knoth -- Particle characterization on surfaces by auger electron spectroscopy / W. F. Stickle, D. Paul and L. A. LaVanier -- Interrogating the behavior of micrometer-sized particles on surfaces with focused acoustic waves / G. J. Breteton and B. A. Bruno -- Removal of glass particles from glass surfaces: a review / A. Ghosh and W. P. Ryszytiwskyj -- Particle removal characteristics of surface cleaning methods involving sonication and/or spray impingement / R. Nagarajan -- Fluid dynamics of liquid jets used for particle removal from surfaces / R. Gim, T. Lesniewski and S. Middleman -- Enhanced particle removal from inertial guidance instrument parts by fluorocarbon surfactant solutions / R. Kaiser -- Laser cleaning techniques for the removal of small surface particulates / A. C. Tam, W. P. Leung and W. Zapka. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Particles |
| Form subdivision |
Congresses. |
| 9 (RLIN) |
95359 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Surfaces (Technology) |
| Form subdivision |
Congresses |
| 9 (RLIN) |
95358 |
| 700 1# - ADDED ENTRY--PERSONAL NAME |
|---|
| Personal name |
Mittal, K. L., |
| Dates associated with a name |
1945- |
| 9 (RLIN) |
95360 |
| 711 2# - ADDED ENTRY--MEETING NAME |
|---|
| Meeting name or jurisdiction name as entry element |
Fine Particle Society. |
| Number (BK CF MP MU SE VM MX) [OBSOLETE] |
Meeting |
| Number of part/section/meeting |
(23rd : |
| Date of meeting |
1992 : |
| Location of meeting |
Las Vegas, Nev.) |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
|---|
| a |
.b10485132 |
| b |
140108 |
| c |
011117 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Suppress in OPAC |
0 |
| -- |
|
| -- |
CRON CRON |
| 969 00 - LOCAL CODES |
|---|
| a |
25017 |
| 979 00 - LOCAL CODES |
|---|
| a |
OB2 |
| b |
02 NOV 2001 |
| 989 00 - LOCAL CODES |
|---|
| a |
OB2 |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) |
|---|
| a |
c |
| Operator's initials, OID (RLIN) |
011115 |
| Cataloger's initials, CIN (RLIN) |
m |
| First Date, FD (RLIN) |
a |
| Local |
- |
| -- |
eng |
| -- |
nyu |
| h |
0 |