MTU Cork Library Catalogue

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Scanning probe microscopy and spectroscopy : methods and applications / Roland Wiesendanger.

By: Wiesendanger, R. (Roland), 1961-.
Material type: materialTypeLabelBookPublisher: Cambridge [England]. New York : Cambridge University Press, 1994Description: xxii, 637 p. : ill. ; 24 cm. + hbk.ISBN: 0521418100; 0521428475 .Subject(s): Scanning probe microscopy | Spectrum analysisDDC classification: 502.82
Contents:
Part one: Experimental methods and theoretical background of scanning probe microscopy and spectroscopy -- Scanning tunneling microscopy (STM) -- Scanning force microscopy (SFM) -- Related scanning probe methods -- Part two: Applications of scanning probe microscopy and spectroscopy -- Condensed matter physics -- Chemistry -- Organic material -- Metrology and standards -- Nanotechnology.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Lending 502.82 (Browse shelf(Opens below)) 1 Available 00016005
Total holds: 0

Enhanced descriptions from Syndetics:

The investigation and manipulation of matter on the atomic scale have been revolutionised by scanning tunnelling microscopy and related scanning probe techniques. This book is the first to provide a clear and comprehensive introduction to this subject. Beginning with the theoretical background of scanning tunnelling microscopy, the design and instrumentation of practical STM and associated systems are described in detail, as are the applications of these techniques in fields such as condensed matter physics, chemistry, biology, and nanotechnology. Containing 350 illustrations, and over 1200 references, this unique book represents an ideal introduction to the subject for final-year undergraduates in physics or materials science. It will also be invaluable to graduate students and researchers in any branch of science where scanning probe techniques are used.

Includes bibliographical references (pages 581-624) and index.

Part one: Experimental methods and theoretical background of scanning probe microscopy and spectroscopy -- Scanning tunneling microscopy (STM) -- Scanning force microscopy (SFM) -- Related scanning probe methods -- Part two: Applications of scanning probe microscopy and spectroscopy -- Condensed matter physics -- Chemistry -- Organic material -- Metrology and standards -- Nanotechnology.

Table of contents provided by Syndetics

  • Preface
  • List of acronyms
  • Introduction
  • Part I Experimental Methods and Theoretical Background of Scanning Probe Microscopy and Spectroscopy
  • 1 Scanning tunnelling microscopy
  • 2 Scanning force microscopy
  • 3 Related scanning probe techniques
  • Part II Applications of Scanning Probe Microscopy and Spectroscopy
  • 4 Condensed matter physics
  • 5 Chemistry
  • 6 Organic materials
  • 7 Metrology and standards
  • 8 Nanotechnology
  • References
  • Index

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