MARC details
000 -LEADER |
fixed length control field |
01409 am a2200325 a 4500 |
001 - CONTROL NUMBER |
control field |
ocm0521418100 |
003 - CONTROL NUMBER IDENTIFIER |
control field |
IE-CoMTU |
005 - DATE AND TIME OF LATEST TRANSACTION |
control field |
20230202124538.0 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
930805s1994 enka rb 001 eng |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
93031700 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0521418100 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0521428475 |
029 ## - OTHER SYSTEM CONTROL NUMBER (OCLC) |
OCLC library identifier |
T15750 |
040 ## - CATALOGING SOURCE |
Modifying agency |
OCoLC |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
502.82 |
100 1# - MAIN ENTRY--PERSONAL NAME |
Personal name |
Wiesendanger, R. |
Fuller form of name |
(Roland), |
Dates associated with a name |
1961- |
9 (RLIN) |
21095 |
245 10 - TITLE STATEMENT |
Title |
Scanning probe microscopy and spectroscopy : |
Remainder of title |
methods and applications / |
Statement of responsibility, etc. |
Roland Wiesendanger. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
Cambridge [England]. |
-- |
New York : |
Name of publisher, distributor, etc. |
Cambridge University Press, |
Date of publication, distribution, etc. |
1994. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xxii, 637 p. : |
Other physical details |
ill. ; |
Dimensions |
24 cm. + |
Accompanying material |
hbk. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references (pages 581-624) and index. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Part one: Experimental methods and theoretical background of scanning probe microscopy and spectroscopy -- Scanning tunneling microscopy (STM) -- Scanning force microscopy (SFM) -- Related scanning probe methods -- Part two: Applications of scanning probe microscopy and spectroscopy -- Condensed matter physics -- Chemistry -- Organic material -- Metrology and standards -- Nanotechnology. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Scanning probe microscopy. |
9 (RLIN) |
45249 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Spectrum analysis. |
9 (RLIN) |
42802 |
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
a |
.b10015139 |
b |
090420 |
c |
011116 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Suppress in OPAC |
0 |
Source of classification or shelving scheme |
Dewey Decimal Classification |
969 00 - LOCAL CODES |
a |
27265 |
979 00 - LOCAL CODES |
a |
OB2 |
b |
30 OCT 2001 |
989 00 - LOCAL CODES |
a |
OB2 |
998 ## - LOCAL CONTROL INFORMATION (RLIN) |
a |
c |
Operator's initials, OID (RLIN) |
011115 |
Cataloger's initials, CIN (RLIN) |
m |
First Date, FD (RLIN) |
a |
Local |
- |
-- |
eng |
-- |
enk |
h |
0 |