MTU Cork Library Catalogue

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The electrical characterization of semiconductors : measurement of minority carrier properties / J.W. Orton and P. Blood.

By: Orton, J. W. (John Wilfred).
Contributor(s): Blood, P. (Peter).
Material type: materialTypeLabelBookSeries: Techniques of physics: 13.Publisher: London : Academic Press, 1990Description: xvii, 291 p. : ill. ; 24 cm. + hbk.ISBN: 0125286252 .Subject(s): Semiconductors -- Materials -- Measurement | Semiconductors -- Diffusion | Semiconductors -- Recombination | Semiconductors -- Impurity distribution | Semiconductors -- DefectsDDC classification: 537.622
Contents:
Introduction -- Minority carrier recombination and generation -- Steady state methods of measuring lifetime -- Transient methods for measuring lifetime -- Modulation methods of measuring lifetime -- The diode step recovery method of measuring -- Scanning methods of measuring diffusion length -- Non scanning methods of measuring diffusion length.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Lending 537.622 (Browse shelf(Opens below)) 1 Available 00027940
Total holds: 0

Enhanced descriptions from Syndetics:

This is the first comprehensive and unified treatment to describe the physical principles behind experimental techniques used for measuring the electrical properties of semiconductors. The principles involved are illustrated by reference to selected examples drawn from the world of semiconductor materials. By concentrating on the physical principles of each technique and enumerating its inherent limitations the authors have produced a text that will be helpful in solving a variety of problems in semiconductor characterization and one that will not be quickly outdated by developments in the materials themselves. Emphasizes the physics and theory underlying the experimental characterization of semicondutors**Deals with the measurement of minority lifetimes and diffusion length**Discusses electrical and optical methods***INCLUDED IN PHYSICS TODAY, SEPT 90***INCLUDED IN MRS BULLETIN, NOVEMBER 90***INCLUDED IN JRNL OF VACUUM SCI, DECEMBER 90***INCLUDED IN PHYSICS TODAY, FEBRUARY 91

Includes bibliographical references (p. 279-286) and index.

Introduction -- Minority carrier recombination and generation -- Steady state methods of measuring lifetime -- Transient methods for measuring lifetime -- Modulation methods of measuring lifetime -- The diode step recovery method of measuring -- Scanning methods of measuring diffusion length -- Non scanning methods of measuring diffusion length.

Table of contents provided by Syndetics

  • Introduction
  • Minority Carrier Recombination and Generation
  • Steady State Methods of Measuring Lifetime
  • Transient Methods for Measuring Lifetime
  • Modulation Methods for Measuring Lifetime
  • The Diode Step Recovery Method of Measuring Lifetime
  • Scanning Methods of Measuring Diffusion Length
  • Non-Scanning Methods of Measuring Diffusion Length

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