Microscale and nanoscale testing of materials using scanning probe technologies / Mark Phelan.
By: Phelan, Mark.
Material type:
BookSeries: M.Sc. - Applied Physics and Instrumentation.Publisher: Cork : CIT, 1998Description: iv, 151 p. various pagings : ill (some col.) ; 30 cm. + hbk.Subject(s): Scanning probe microscopy
| Scanning tunneling microscopyDDC classification: THESES PRESS Dissertation note: Thesis (M.Sc.) - Cork Institute of Technology, 1998.
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| Reference | MTU Bishopstown Library Thesis | THESES PRESS (Browse shelf(Opens below)) | 1 | Reference | 00080831 |
Total holds: 0
Thesis (M.Sc.) - Cork Institute of Technology, 1998.
Bibliography: p. 142-151.