Scanning tunneling microscopy / edited by Joseph A. Stroscio and William J. Kaiser.
Contributor(s): Stroscio, Joseph Anthony | Kaiser, William J. (William Joseph).
Material type: BookSeries: Methods of experimental physics ; v. 27.Publisher: San Diego : Academic Press, c1993Description: xvii, 459 p. : ill. (some col.) ; 23 cm. + hbk.ISBN: 012674050X.Subject(s): Scanning tunneling microscopyDDC classification: 502.82Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
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General Lending | MTU Bishopstown Library Lending | 502.82 (Browse shelf(Opens below)) | 1 | Available | 00013616 |
Enhanced descriptions from Syndetics:
In little more than a decade, the scanning tunneling microscope (STM) has revolutionized surface science and related fields. This introduction covers the theory, design and applications of scanning tunnelling microscopy and should be of interest to researchers and graduate students in the physical sciences and engineering, especially surface scientists.
Includes bibliographical references and index.
Theory of scanning tunneling microscopy -- Design considerations for an STM system -- Extensions of STM -- Methods of tunneling spectroscopy -- Semiconductor surfaces -- Metal surfaces -- Ballistic electron emission microscopy -- Charge-density waves -- Superconductors.
Table of contents provided by Syndetics
- Theory of Scanning Tunneling Microscopy
- Design Considerations for an STM System
- Extensions of STM
- Tunneling Spectroscopy
- Semiconductor Surfaces
- Metal Surfaces
- Ballistic Electron Emission Microscopy
- Charge-Density Waves
- Superconductors
- Chapter References
- Subject Index