MTU Cork Library Catalogue

Syndetics cover image
Image from Syndetics

X-rays, electrons, and analytical chemistry : spectrochemical analysis with X-rays / H. A. Liebhafsky, H.G. Pfeiffer, E.H. Winslow and P.D. Zemany ; collaborating editor Sybil Small Liebhafsky.

Contributor(s): Liebhafsky, H. A [author.] | Pfeiffer, H. G [author.] | Winslow, E. H [author.] | Zemany, P. D [author.] | Liebhafsky, Sybil Small [editor.].
Material type: materialTypeLabelBookPublisher: New York : Wiley Interscience, [1972]Copyright date: ©1972Description: xii, 566 pages : illustrations ; 23 cm.Content type: text Media type: unmediated Carrier type: volumeISBN: 0471534285 (hardback).Subject(s): X-ray spectroscopyDDC classification: 543.62
Contents:
General and properties of X-rays -- The measurement of X-ray intensity, X-ray detectors and detector systems energy resolution -- Absorptiometry with X-rays -- X-ray spectra -- The selection of X-ray wavelengths -- X-ray diffraction in chemical analysis -- Measurement of film thickness simple trace determinations -- Reliability of X-ray emission spectrography statistical considerations -- X-ray emission spectrography. General -- Equipment and selected applications.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Store Item 543.62 (Browse shelf(Opens below)) 1 Available 00044996
Total holds: 0

Includes bibliographical references and index.

General and properties of X-rays -- The measurement of X-ray intensity, X-ray detectors and detector systems energy resolution -- Absorptiometry with X-rays -- X-ray spectra -- The selection of X-ray wavelengths -- X-ray diffraction in chemical analysis -- Measurement of film thickness simple trace determinations -- Reliability of X-ray emission spectrography statistical considerations -- X-ray emission spectrography. General -- Equipment and selected applications.

Powered by Koha