Image from Syndetics
Image based measurement systems : object recognition and parameter estimation / Ferdinand van der Heijden.
By: Heijden, Ferdinand van der
.
Material type: 
BookPublisher: Chichester : Wiley, c1994Description: viii, 338 p., [2] p. of plates : ill. ; 26 cm.ISBN: 0471950629 .Subject(s): Image processing | Computer vision | Pattern recognition systems | Parameter estimationDDC classification: 006.42
| Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Store Item | 006.42 (Browse shelf(Opens below)) | 1 | Available | 00014435 |
Total holds: 0
Enhanced descriptions from Syndetics:
What makes this book unique is that besides information on image processing of objects to yield knowledge, the author has devoted a lot of thought to the measurement factor of image processing. This is of direct practical use in numerous sectors from industrial quality and robotics to medicine and biology.
Includes bibliographical references and index.
Table of contents provided by Syndetics
- Image Formation
- Image Models
- Image Acquisition
- Image Operations
- Statistical Pattern Classification and Parameter Estimation
- Image Analysis
- Appendices
- Bibliography
- Index
Author notes provided by Syndetics
Dr. Ferdinand van der Heijden, Ph.D., is on the faculty of the Department of Signals and Systems, University of Twente, Netherlands.