Electron microscopy and analysis / P.J. Goodhew and F.J. Humphreys.
By: Goodhew, Peter J.
Contributor(s): Humphreys, F. J.
Material type: BookPublisher: London. New York : Taylor & Francis, 1988Edition: 2nd ed.Description: xi, 232 p. : ill. ; 24 cm. + hbk.ISBN: 0850664152 ; 0850664144 .Subject(s): Electron microscopyDDC classification: 502.825Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
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General Lending | MTU Bishopstown Library Lending | 502.825 (Browse shelf(Opens below)) | 1 | Available | 00027933 |
Enhanced descriptions from Syndetics:
A comprehensive introductory text, extensively revised and updated to cover the physical basis and operation of the common types of electron microscope with illustrations of their applications. In addition, electron microscopy is compared with other modern techniques for examining both crystalline
Includes bibliographical references (pages 222-223) and index.
Microscopy with light and electrons -- Electrons and their interaction with the specimen -- Electron diffraction -- The transmission electron microscope -- The scanning electron microscope -- Chemical analysis in the electron microscope -- Electron microscopy and other techniques.