Phelan, Mark. <br/><br/>
Microscale and nanoscale testing of materials using scanning probe technologies / 
Mark Phelan. 
 - Cork :  CIT,  1998. 
 - iv, 151 p. various pagings :  ill (some col.) ;  30 cm. +  hbk. 
 - M.Sc. - Applied Physics and Instrumentation .
<br/><br/>Thesis (M.Sc.) - Cork Institute of Technology, 1998. 
<br/><br/>Bibliography: p. 142-151. 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning probe microscopy.<br/>Scanning tunneling microscopy.
<br/><br/><label>Dewey Class. No.: </label>THESES PRESS