Scanning probe microscopy and spectroscopy : methods and applications /
Roland Wiesendanger.
- Cambridge [England]. New York : Cambridge University Press, 1994.
- xxii, 637 p. : ill. ; 24 cm. + hbk.
Includes bibliographical references (pages 581-624) and index.
Part one: Experimental methods and theoretical background of scanning probe microscopy and spectroscopy -- Scanning tunneling microscopy (STM) -- Scanning force microscopy (SFM) -- Related scanning probe methods -- Part two: Applications of scanning probe microscopy and spectroscopy -- Condensed matter physics -- Chemistry -- Organic material -- Metrology and standards -- Nanotechnology.