Chen, C. Julian. <br/><br/>
Introduction to scanning tunneling microscopy / 
Julian Chen. 
 - New York :  Oxford University Press,  1993. 
 - xxii, 412 p., 31 p. of plates :  ill. ;  24 cm. +  hbk. 
 - Oxford Series in Optical and Imaging Sciences ;  4 .
 - Oxford series in optical and imaging sciences ;  4. .
<br/><br/>Includes bibliographical references (p. 383-404) and index.. 
<br/><br/>Overview -- Atom-scale tunneling -- Tunneling matrix elements -- Wave functions at surfaces -- Imaging crystalline surfaces -- Imaging atomic states -- Atomic forces and tunneling -- Tip-sample interactions -- Piezoelectric scanner -- Vibration isolation -- Electronics isolation -- Electronics and control -- Coarse positioner and STM design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy -- Illustrative applications. 
<br/><br/><label>ISBN: </label>0195071506 
<br/><br/><label>LCCN: </label>92040047 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Scanning tunneling microscopy.
<br/><br/><label>Dewey Class. No.: </label>502.82