Briggs, D.  1948- <br/><br/>
Handbook of static secondary ion mass spectrometry / 
D. Briggs, A. Brown and J. C. Vickerman. 
 - Chichester :  J. Wiley,  1989. 
 - 156 p. :  ill. ;  22 cm. 
<br/><br/>Includes bibliographical references and index. 
<br/><br/>Part A Static secondary ion mass spectrometry for surface chemical characterization:  Introduction -- The SIMS phenomenon -- The experimental parameters -- The SIMS experiment -- Experimental procedures used in acquisition of spectra -- Part B Library of spectra:  Introduction -- Part C Case studies:  Static SIMS in surface science -- Semi-quantitative analysis of random ethyl methyacrylate:  hydroxethyl methacrylate copolymer films -- Surface segregation in segmented poly (ether urethanes) -- Drug distribution in a polymeric drug delivery system -- Use of isotopes substitution in polymer surface analysis -- The use of MS/MS techniques in materials analysis -- Cleaning of semiconductor materials -- Analysis of contamination in paint film 'craters' -- SIMS imaging of the mechanism of oxide growth -- SIMS imaging of semiconductor devices -- High resolution time-of-flight molecular ion imaging. 
<br/><br/><label>ISBN: </label>0471916277  
<br/><br/><label>LCCN: </label>88020499 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Secondary ion mass spectrometry.
<br/><br/><label>Dewey Class. No.: </label>543.0873