Miczo, Alexander. <br/><br/>
Digital logic testing and simulation / 
Alexander Miczo. 
 - New York :  John Wiley,  1987. 
 - xiv, 414 p. :  ill. ;  24 cm. 
<br/><br/> Includes bibliographical references and index. 
<br/><br/>Introduction -- Combinational logic test -- Sequential logic test -- Simulation -- The automatic test pattern generator -- Automatic test equipment -- Design-for-test -- Memory system design and test -- Self-test and fault tolerance -- Functional test and other topics. 
<br/><br/><label>ISBN: </label>047161307X  T4766 
<br/><br/><label>LCCN: </label>85021884 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Digital electronics
<br/><br/><label>Dewey Class. No.: </label>621.3815