Microstructural characterization of materials /
David Brandon and Wayne D. Kaplan.
- Chichester : Wiley, c1999.
- xiii, 409 p. : ill. (some col.) ; 23 cm. + pbk.
Includes bibliographical references and index.
The concept of microstructure -- Diffraction analysis of crystal structure -- Optical microscopy -- Electron microscopy -- Microanalysis in electron microscopy -- Chemical analysis of surface composition -- Quantitative analysis of microstructure.