Handbook of static secondary ion mass spectrometry / D. Briggs, A. Brown and J. C. Vickerman.
By: Briggs, D. (David)
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Contributor(s): Brown, A. (Alan) | Vickerman, J. C.
Material type: 
BookPublisher: Chichester : J. Wiley, 1989Description: 156 p. : ill. ; 22 cm.ISBN: 0471916277 .Subject(s): Secondary ion mass spectrometryDDC classification: 543.0873 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 543.0873 (Browse shelf(Opens below)) | 1 | Available | 00029672 |
Enhanced descriptions from Syndetics:
A collection of spectral static SIMS spectra from over 100 compounds. Each compound listed has spectra over a 400 mass range for both positive and negative ions, with description of the spectra and information on how to extrapolate from this representative compound to others of its type. Covers five classes of compounds--metal oxides/hydroxides, metal salts, polymers, surface contaminants, and semiconductors--as well as other advanced-technology materials. Part I covers technique: instrumentation, physical basis of SIMS, spectroscopic information, sample handling, inter-instrument comparison, and references. Part II contains the actual spectra.
Includes bibliographical references and index.
Part A Static secondary ion mass spectrometry for surface chemical characterization: Introduction -- The SIMS phenomenon -- The experimental parameters -- The SIMS experiment -- Experimental procedures used in acquisition of spectra -- Part B Library of spectra: Introduction -- Part C Case studies: Static SIMS in surface science -- Semi-quantitative analysis of random ethyl methyacrylate: hydroxethyl methacrylate copolymer films -- Surface segregation in segmented poly (ether urethanes) -- Drug distribution in a polymeric drug delivery system -- Use of isotopes substitution in polymer surface analysis -- The use of MS/MS techniques in materials analysis -- Cleaning of semiconductor materials -- Analysis of contamination in paint film 'craters' -- SIMS imaging of the mechanism of oxide growth -- SIMS imaging of semiconductor devices -- High resolution time-of-flight molecular ion imaging.