Embedded systems design : an introduction to processes, tools, and techniques / Arnold Berger.

By: Berger, Arnold S .

Material type: materialTypeLabel

BookPublisher: Lawrence, Kan. : Berkeley, CA : CMP Books ; Distributed in the U.S. and Canada by Publishers Group West, c2002Description: xxviii, 237 p. : ill. ; 24 cm. + pbk.ISBN: 1578200733.Subject(s): Embedded computer systems -- Programming

DDC classification: 005.26

Contents:

Introduction -- The Embedded Design Life Cycle -- The Selection Process -- The Partitioning Decision -- The Development Environment -- Special Software Techniques -- A Basic Toolset -- BDM, JTAG and Nexus -- The ICE - An Integrated Solution -- Testing -- The Future.

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Item type	Current library	Call number	Copy number	Status	Notes	Barcode
General Lending	MTU Bishopstown Library Lending	005.26 (Browse shelf(Opens below))	1	Available	CIT Module COMH 9001 - Core reading.	00084575
General Lending	MTU Bishopstown Library Lending	005.26 (Browse shelf(Opens below))	1	Available		00084574
General Lending	MTU Bishopstown Library Lending	005.26 (Browse shelf(Opens below))	1	Available		00084573

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Enhanced descriptions from Syndetics:

* Hardware/Software Partitioning * Cross-Platform Development * Firmware Debugging * Performance Analysis * Testing & Integration Get into embedded systems programming with a clear understanding of the development cycle and the specialized aspects of

Includes bibliographical references and index.

CIT Module COMH 9001 - Core reading

CIT Module ELTR 7019 - Supplementary reading

Table of contents provided by Syndetics

Preface (p. xi)
What is this book about? (p. xii)
Why should you buy this book? (p. xii)
If you are one of my students (p. xii)
If you are a student elsewhere or a recent graduate (p. xiii)
If you are a working engineer or developer (p. xiii)
If you are a manager (p. xiii)
How is the book structured? (p. xiv)
What do I expect you to know? (p. xiv)
Acknowledgments (p. xv)
Introduction (p. xvii)
Why Embedded Systems Are Different (p. xviii)
Summary (p. xxvi)
Works Cited (p. xxvii)
Chapter 1 The Embedded Design Life Cycle (p. 1)
Introduction (p. 1)
Product Specification (p. 4)
Hardware/Software Partitioning (p. 7)
Iteration and Implementation (p. 10)
Detailed Hardware and Software Design (p. 11)
Hardware/Software Integration (p. 12)
Product Testing and Release (p. 15)
Who Does the Testing? (p. 16)
Maintaining and Upgrading Existing Products (p. 17)
Summary (p. 19)
Work Cited (p. 19)
Chapter 2 The Selection Process (p. 21)
Packaging the Silicon (p. 23)
Microprocessor versus Microcontroller (p. 24)
Silicon Economics (p. 25)
Using the Core As the Basis of a Microcontroller (p. 25)
System-on-Silicon (SoS) (p. 26)
Adequate Performance (p. 26)
Performance-Measuring Tools (p. 26)
Meaningful Benchmarking (p. 28)
Running Benchmarks (p. 31)
RTOS Availability (p. 32)
Language/Microprocessor Support (p. 32)
Tool Compatibility (p. 34)
Performance (p. 35)
Device Drivers (p. 35)
Debugging Tools (p. 36)
Standards Compatibility (p. 36)
Technical Support (p. 36)
Source Code vs. Object Code (p. 37)
Services (p. 37)
Tool Chain Availability (p. 38)
Compilers (p. 39)
Hardware and Software Debugging Tools (p. 40)
Other Issues in the Selection Process (p. 41)
A Prior Commitment to a Particular Processor Family (p. 42)
A Prior Restriction on Language (p. 42)
Time to Market (p. 42)
Additional Reading (p. 44)
Summary (p. 45)
Works Cited (p. 45)
Chapter 3 The Partitioning Decision (p. 47)
Hardware/Software Duality (p. 48)
Hardware Trends (p. 50)
"Coding" Hardware (p. 52)
The ASIC Revolution (p. 55)
ASICs and Revision Costs (p. 58)
Managing the Risk (p. 60)
Co-Verification (p. 61)
Additional Reading (p. 66)
Summary (p. 66)
Works Cited (p. 67)
Chapter 4 The Development Environment (p. 69)
The Execution Environment (p. 70)
Memory Organization (p. 70)
System Space (p. 71)
Code Space (p. 71)
Data Space (p. 71)
Unpopulated Memory Space (p. 72)
I/O Space (p. 72)
System Startup (p. 73)
Interrupt Response Cycle (p. 74)
Function Calls and Stack Frames (p. 75)
Run-Time Environment (p. 77)
Object Placement (p. 82)
Additional Reading (p. 87)
Summary (p. 87)
Works Cited (p. 88)
Chapter 5 Special Software Techniques (p. 89)
Manipulating the Hardware (p. 89)
In-line Assembly (p. 90)
Memory-Mapped Access (p. 91)
Bitwise Operations (p. 92)
Using the Storage Class Modifier Volatile (p. 93)
Speed and Code Density (p. 95)
Interrupts and Interrupt Service Routines (ISRs) (p. 97)
From Polling Loop to Interrupt-Driven (p. 97)
Nested Interrupts and Reentrancy (p. 98)
Measuring Execution Time (p. 100)
Watchdog Timers (p. 102)
Watchdog Timer: Debugging the Target System (p. 104)
Flash Memory (p. 104)
Design Methodology (p. 106)
Additional Reading (p. 109)
Summary (p. 109)
Works Cited (p. 110)
Chapter 6 A Basic Toolset (p. 111)
Host-Based Debugging (p. 112)
Word Size (p. 112)
Byte Order (p. 112)
Remote Debuggers and Debug Kernels (p. 115)
ROM Emulator (p. 121)
Limitations (p. 123)
Intrusiveness and Real-Time Debugging (p. 124)
Logic Analyzer (p. 129)
Timing Mode (p. 129)
State Mode (p. 131)
Triggers (p. 132)
State Transitions (p. 136)
Limitations (p. 138)
Physical Connections (p. 138)
Logic Analyzers and Caches (p. 139)
Compiler Optimizations (p. 142)
Cost Benefit (p. 142)
Other Uses (p. 142)
Statistical Profiling (p. 142)
Summary (p. 144)
Works Cited (p. 146)
Chapter 7 BDM, JTAG, and Nexus (p. 149)
Background Debug Mode (p. 150)
Joint Test Action Group (JTAG) (p. 155)
Nexus (p. 159)
Summary (p. 164)
Chapter 8 The ICE--An Integrated Solution (p. 165)
Bullet-Proof Run Control (p. 166)
Real-Time Trace (p. 169)
Hardware Breakpoints (p. 173)
Overlay Memory (p. 174)
Timing Constraints (p. 178)
Usage Issues (p. 181)
Setting the Trigger (p. 181)
Additional Reading (p. 182)
Summary (p. 182)
Work Cited (p. 183)
Chapter 9 Testing (p. 185)
Why Test? (p. 185)
To Find the Bugs (p. 186)
To Reduce Risk (p. 186)
To Reduce Costs (p. 187)
To Improve Performance (p. 187)
When to Test? (p. 187)
Unit Testing (p. 188)
Regression Testing (p. 188)
Which Tests? (p. 189)
When to Stop? (p. 190)
Choosing Test Cases (p. 191)
Functional Tests (p. 191)
Coverage Tests (p. 192)
Testing Embedded Software (p. 193)
Real-Time Failure Modes (p. 195)
Measuring Test Coverage (p. 197)
Performance Testing (p. 201)
How to Test Performance (p. 202)
Maintenance and Testing (p. 206)
Additional Reading (p. 207)
Summary (p. 207)
Works Cited (p. 208)
Chapter 10 The Future (p. 209)
Reconfigurable Hardware (p. 209)
Some Comments on the Tool Business (p. 214)
Tool/Chip Tension (p. 220)
Summary (p. 224)
Works Cited (p. 225)
Index (p. 227)

Author notes provided by Syndetics

Dr. Arnold Berger is a Senior Lecturer in the Computing and Software Systems Department at the University of Washington-Bothell. He received his BS and PhD degrees from Cornell University. Dr. Berger has held positions as an R&D Director at Applied Microsystems Corporation, Embedded Tools Marketing Manager at Advanced Micro Devices and R&D Project Manager at Hewlett-Packard. Dr. Berger has published over 40 papers on embedded systems. He holds three patents.