Embedded systems design : an introduction to processes, tools, and techniques / Arnold Berger.
By: Berger, Arnold S.
Material type: BookPublisher: Lawrence, Kan. : Berkeley, CA : CMP Books ; Distributed in the U.S. and Canada by Publishers Group West, c2002Description: xxviii, 237 p. : ill. ; 24 cm. + pbk.ISBN: 1578200733.Subject(s): Embedded computer systems -- ProgrammingDDC classification: 005.26Item type | Current library | Call number | Copy number | Status | Notes | Date due | Barcode | Item holds |
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General Lending | MTU Bishopstown Library Lending | 005.26 (Browse shelf(Opens below)) | 1 | Available | CIT Module COMH 9001 - Core reading. | 00084575 | ||
General Lending | MTU Bishopstown Library Lending | 005.26 (Browse shelf(Opens below)) | 1 | Available | 00084574 | |||
General Lending | MTU Bishopstown Library Lending | 005.26 (Browse shelf(Opens below)) | 1 | Available | 00084573 |
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Enhanced descriptions from Syndetics:
* Hardware/Software Partitioning * Cross-Platform Development * Firmware Debugging * Performance Analysis * Testing & Integration Get into embedded systems programming with a clear understanding of the development cycle and the specialized aspects of
Includes bibliographical references and index.
Introduction -- The Embedded Design Life Cycle -- The Selection Process -- The Partitioning Decision -- The Development Environment -- Special Software Techniques -- A Basic Toolset -- BDM, JTAG and Nexus -- The ICE - An Integrated Solution -- Testing -- The Future.
CIT Module COMH 9001 - Core reading
CIT Module ELTR 7019 - Supplementary reading
Table of contents provided by Syndetics
- Preface (p. xi)
- What is this book about? (p. xii)
- Why should you buy this book? (p. xii)
- If you are one of my students (p. xii)
- If you are a student elsewhere or a recent graduate (p. xiii)
- If you are a working engineer or developer (p. xiii)
- If you are a manager (p. xiii)
- How is the book structured? (p. xiv)
- What do I expect you to know? (p. xiv)
- Acknowledgments (p. xv)
- Introduction (p. xvii)
- Why Embedded Systems Are Different (p. xviii)
- Summary (p. xxvi)
- Works Cited (p. xxvii)
- Chapter 1 The Embedded Design Life Cycle (p. 1)
- Introduction (p. 1)
- Product Specification (p. 4)
- Hardware/Software Partitioning (p. 7)
- Iteration and Implementation (p. 10)
- Detailed Hardware and Software Design (p. 11)
- Hardware/Software Integration (p. 12)
- Product Testing and Release (p. 15)
- Who Does the Testing? (p. 16)
- Maintaining and Upgrading Existing Products (p. 17)
- Summary (p. 19)
- Work Cited (p. 19)
- Chapter 2 The Selection Process (p. 21)
- Packaging the Silicon (p. 23)
- Microprocessor versus Microcontroller (p. 24)
- Silicon Economics (p. 25)
- Using the Core As the Basis of a Microcontroller (p. 25)
- System-on-Silicon (SoS) (p. 26)
- Adequate Performance (p. 26)
- Performance-Measuring Tools (p. 26)
- Meaningful Benchmarking (p. 28)
- Running Benchmarks (p. 31)
- RTOS Availability (p. 32)
- Language/Microprocessor Support (p. 32)
- Tool Compatibility (p. 34)
- Performance (p. 35)
- Device Drivers (p. 35)
- Debugging Tools (p. 36)
- Standards Compatibility (p. 36)
- Technical Support (p. 36)
- Source Code vs. Object Code (p. 37)
- Services (p. 37)
- Tool Chain Availability (p. 38)
- Compilers (p. 39)
- Hardware and Software Debugging Tools (p. 40)
- Other Issues in the Selection Process (p. 41)
- A Prior Commitment to a Particular Processor Family (p. 42)
- A Prior Restriction on Language (p. 42)
- Time to Market (p. 42)
- Additional Reading (p. 44)
- Summary (p. 45)
- Works Cited (p. 45)
- Chapter 3 The Partitioning Decision (p. 47)
- Hardware/Software Duality (p. 48)
- Hardware Trends (p. 50)
- "Coding" Hardware (p. 52)
- The ASIC Revolution (p. 55)
- ASICs and Revision Costs (p. 58)
- Managing the Risk (p. 60)
- Co-Verification (p. 61)
- Additional Reading (p. 66)
- Summary (p. 66)
- Works Cited (p. 67)
- Chapter 4 The Development Environment (p. 69)
- The Execution Environment (p. 70)
- Memory Organization (p. 70)
- System Space (p. 71)
- Code Space (p. 71)
- Data Space (p. 71)
- Unpopulated Memory Space (p. 72)
- I/O Space (p. 72)
- System Startup (p. 73)
- Interrupt Response Cycle (p. 74)
- Function Calls and Stack Frames (p. 75)
- Run-Time Environment (p. 77)
- Object Placement (p. 82)
- Additional Reading (p. 87)
- Summary (p. 87)
- Works Cited (p. 88)
- Chapter 5 Special Software Techniques (p. 89)
- Manipulating the Hardware (p. 89)
- In-line Assembly (p. 90)
- Memory-Mapped Access (p. 91)
- Bitwise Operations (p. 92)
- Using the Storage Class Modifier Volatile (p. 93)
- Speed and Code Density (p. 95)
- Interrupts and Interrupt Service Routines (ISRs) (p. 97)
- From Polling Loop to Interrupt-Driven (p. 97)
- Nested Interrupts and Reentrancy (p. 98)
- Measuring Execution Time (p. 100)
- Watchdog Timers (p. 102)
- Watchdog Timer: Debugging the Target System (p. 104)
- Flash Memory (p. 104)
- Design Methodology (p. 106)
- Additional Reading (p. 109)
- Summary (p. 109)
- Works Cited (p. 110)
- Chapter 6 A Basic Toolset (p. 111)
- Host-Based Debugging (p. 112)
- Word Size (p. 112)
- Byte Order (p. 112)
- Remote Debuggers and Debug Kernels (p. 115)
- ROM Emulator (p. 121)
- Limitations (p. 123)
- Intrusiveness and Real-Time Debugging (p. 124)
- Logic Analyzer (p. 129)
- Timing Mode (p. 129)
- State Mode (p. 131)
- Triggers (p. 132)
- State Transitions (p. 136)
- Limitations (p. 138)
- Physical Connections (p. 138)
- Logic Analyzers and Caches (p. 139)
- Compiler Optimizations (p. 142)
- Cost Benefit (p. 142)
- Other Uses (p. 142)
- Statistical Profiling (p. 142)
- Summary (p. 144)
- Works Cited (p. 146)
- Chapter 7 BDM, JTAG, and Nexus (p. 149)
- Background Debug Mode (p. 150)
- Joint Test Action Group (JTAG) (p. 155)
- Nexus (p. 159)
- Summary (p. 164)
- Chapter 8 The ICE--An Integrated Solution (p. 165)
- Bullet-Proof Run Control (p. 166)
- Real-Time Trace (p. 169)
- Hardware Breakpoints (p. 173)
- Overlay Memory (p. 174)
- Timing Constraints (p. 178)
- Usage Issues (p. 181)
- Setting the Trigger (p. 181)
- Additional Reading (p. 182)
- Summary (p. 182)
- Work Cited (p. 183)
- Chapter 9 Testing (p. 185)
- Why Test? (p. 185)
- To Find the Bugs (p. 186)
- To Reduce Risk (p. 186)
- To Reduce Costs (p. 187)
- To Improve Performance (p. 187)
- When to Test? (p. 187)
- Unit Testing (p. 188)
- Regression Testing (p. 188)
- Which Tests? (p. 189)
- When to Stop? (p. 190)
- Choosing Test Cases (p. 191)
- Functional Tests (p. 191)
- Coverage Tests (p. 192)
- Testing Embedded Software (p. 193)
- Real-Time Failure Modes (p. 195)
- Measuring Test Coverage (p. 197)
- Performance Testing (p. 201)
- How to Test Performance (p. 202)
- Maintenance and Testing (p. 206)
- Additional Reading (p. 207)
- Summary (p. 207)
- Works Cited (p. 208)
- Chapter 10 The Future (p. 209)
- Reconfigurable Hardware (p. 209)
- Some Comments on the Tool Business (p. 214)
- Tool/Chip Tension (p. 220)
- Summary (p. 224)
- Works Cited (p. 225)
- Index (p. 227)