Optical characterization of semiconductors : infrared, raman, and photoluminescence spectroscopy / Sidney Perkowitz.
By: Perkowitz, S
.
Material type: 
BookSeries: Techniques of physics ; no.14.Publisher: London : Academic, c1993Description: x, 220 p. : ill. ; 25 cm. + hbk.ISBN: 0125507704.Subject(s): Semiconductors -- Testing -- Optical methods | Semiconductors -- Optical propertiesDDC classification: 537.623 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 537.623 (Browse shelf(Opens below)) | 1 | Available | 00015503 |
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Enhanced descriptions from Syndetics:
This book discusses and compares three principle optical methods (infrared, Raman and photoluminescence analysis) for non-destructive characterization of semi-conducting materials, structures, and devices. Applications are illustrated through many case studies in silicon, GaAs, AIxGal-xAs and other important materials.
Bibliography: p. 207-215. - Includes index.
Introduction -- Optical theory for semiconductor characterization -- Optical physics of semiconductors -- Measurement methods -- Case studies:photoluminescence characterization -- Case studies:Raman characterization -- Case studies:infrared characterization -- Summary and future trends.
Table of contents provided by Syndetics
- Introduction
- Optical Theory for Semiconductor Characterization
- Optical Physics of Semiconductors
- Measurement Methods
- Case Studies: Photoluminescence Characterization
- Case Studies: Raman Characterization
- Case Studies: Infrared Characterization
- Summary and Future Trends
- References
- Subject Index