Microscopy of semiconducting materials, 1985 : proceedings of the Royal Microscopical Society Conference held in St. Catherine's College, Oxford, 25-27 March 1985 / edited by A. G. Cullis and D. B. Holt.
By: Royal Microscopical Society (Great Britain). Conference (1985 : Oxford, England).
Contributor(s): Cullis, A. G
| Holt, D. B | Royal Microscopical Society (Great Britain).
Material type: 
BookSeries: Conference series (Institute of Physics (Great Britain)).Publisher: Bristol : Hilger, 1985Description: [520] p. : ill. ; 24 cm. + hbk.ISBN: 0854981675.Subject(s): Semiconductors -- Research | Electron microscopyDDC classification: 537.622 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 537.622 (Browse shelf(Opens below)) | 1 | Available | 00036045 |
Enhanced descriptions from Syndetics:
Provides an overview of developments in transmission and scanning electron microscopy to the study of the structure and electrical properties of semiconducting materials. Spans the range of elemental and compound semiconductors. Of interest to researchers in condensed matter, materials science and device physics.
Includes index.
High resolution microscopy -- Properties of dislocations -- Transient processing phenomena -- Silicon characterization -- Silicides -- Compound semiconductor characterization -- Superlattices -- Scanning ebic and cl -- Microanalysis -- X ray techniques -- Device silicon assessment by transmission microscopy -- Device testing by scanning microscopy.