In-circuit testing / Allen Buckroyd.
By: Buckroyd, Allen
.
Material type: 
BookPublisher: Jordan Hill, Oxford, England ; Boston : Butterworth-Heinemann, 1994Description: xiv, 168 p. : ill. ; 24 cm.ISBN: 0750609303.Subject(s): Printed circuits -- TestingDDC classification: 621.3815 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 621.3815 (Browse shelf(Opens below)) | 1 | Available | 00013039 |
Enhanced descriptions from Syndetics:
A practical guide to introducing into the manufacturing process a system for verifying the resistance, capacitive and inductive reactance, and other parameters of individual components of an electronic circuit that has already been assembled. Provides advice on the available equipment, what the technique can and cannot do, the benefits and drawbacks, programming, interfacing, fault finding, and other aspects. For engineers and technicians considering or implementing such a system. Annotation c. by Book News, Inc., Portland, Or.
Includes bibliographical references and index.
Introduction -- Application -- Programming - procedures, problems and solutions -- Interfacing - procedures, problems and solutions -- Fault diagnosis -- Designing for in-circuit test -- Conclusion.