Materials science and technology : a comprehensive treatment. Vol. 2A, Characterization of materials, Part 1 / edited by R.W. Cahn, P. Haasen, E.J. Kramer
Contributor(s): Cahn, R. W. (Robert W.)
| Haasen, P. (Peter) | Kramer, E. J. (Edward J.).
Material type: 
BookPublisher: Weinheim : VCH, 1992Description: 724 p. : ill. ; 25 cm. + hbk.ISBN: 3527268154 .Subject(s): Materials | Materials scienceDDC classification: 620.11 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 620.11 (Browse shelf(Opens below)) | 1 | Available | 00070215 |
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Enhanced descriptions from Syndetics:
The first book of a two-part volume dealing with the methods of characterizing metals, ceramics, polymers and related materials.
From the Contents:
Amelinckx: Electron Diffraction and Transmission Electron Microscopy. Hall: Analytical Electron Microscopy. Joy: Scanning Electron Microscopy. Snyder: X-Ray Diffraction. Telle/Petzow: Light Optical Microscopy. Keliher/Skelly Frame: Atomic Spectrometry. Gallagher: Thermoanalytical Methods. Gerson/Halfpenny/Pizzini/Ristic/Roberts/Sheen/Sherwood: Application of Synchrotron X-Radiation to Problems in Materials Science. Jenkins: X-Ray Fluorescence Analysis. Williams: Polymer Molecular Structure Determination.
Volume 2A of Materials Science and Technology. Volume 2B has the title 'Characterization of Materials, Part 11'.
Includes bibliographical references and index.
Electron diffraction and transmission electron microscopy / S. Amelinckx -- Analytical electron microscopy / E. L. Hall -- Scanning electron microscopy / D. C. Joy -- X-Ray diffraction / R. L. Snyder -- Light optical microscopy / R. Telle, G. Petzow -- Atomic spectrometry / P. N. Keliher, E. M. Skelly Frame -- Thermoanalytical methods / P. K. Gallagher -- Application of synchrotron x-radiation to problems in materials science / A. R. Gerson, P. J. Halfpenny, S. Pizzini, R. Ristic, K. J. Roberts, D. B. Sheen, J. N. Sherwood -- X-ray fluorescence analysis / R. Jenkins -- Polymer molecular structure determination / E. A. Williams.
Table of contents provided by Syndetics
- Electron Diffraction and Transmission
- Electron Microscopy of Materials
- Analytical Electron Microscopy
- Scanning Electron
- Microscopy Scanning
- Tunnelling Light Optical Microscopy
- Atomic Spectroscopy
- Thermoanalytical Methods X-Ray
- Diffraction
- Application of Synchroton X-Ray
- Radiation to Problems in Material Science