MTU Cork Library Catalogue

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Materials science and technology : a comprehensive treatment. Vol. 2B, Characterization of materials, part 2 / edited by R.W. Cahn, P. Haasen, E.J. Kramer.

Contributor(s): Cahn, R. W. (Robert W.), 1924-2007 | Haasen, P. (Peter) | Kramer, E. J. (Edward J.).
Material type: materialTypeLabelBookPublisher: Weinheim ; Cambridge : VCH, c1994Description: 775 p. : ill. ; 25 cm. + hbk.ISBN: 1560811285 ; 3527282653 ; 3527268138 ; 1560811900 .Subject(s): Materials science | MaterialsDDC classification: 620.11
Contents:
Nanoscale characterization of surfaces and interfaces / N. J. DiNardo -- Mechanical spectroscopy / R. De Batist -- Scanning auger microscopy / M. A. Baker, J. E. Castle -- Quantitative acoustic microscopy / A. Briggs -- Quantitative description of microstructures by image analysis / H. E. Exner -- Electron microprobe analysis / E. Lifshin -- High energy ion beam analysis techniques / W.-K. Chu, J. Liu, Z. Zhang, K. B. Ma -- Field-Ion microscopy and atom probe analysis / A. Cerezo, G. D. W. Smith -- Neutron diffraction / R. B. Von Dreele -- Small-angle scattering of x-rays and neutrons / C. E. Williams, R. P. May, A. Guinier -- Characterization of surfaces, interfaces and thin films of organic materials / D. L. Allara, P. Zhang.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Lending 620.11 (Browse shelf(Opens below)) 1 Available 00070216
Total holds: 0

Enhanced descriptions from Syndetics:

The 18-volume series "Materials Science and Technology" is a topic- oriented, state-of-the-art reference that covers the most important classes of materials: metals, ceramics, glasses, polymers, semiconductors, and composites. Each volume deals with properties, processing, applications, or general phenomena associated with these materials. The present volume is the second of two parts (Part 2A is reviewed in the May 1993 Sci-Tech Book News) focusing on the principal analytical techniques for characterizing metal alloys, semiconductors, polymers, and ceramics. Topics include STM, mechanical spectroscopy, scanning Auger microscopy, acoustic microscopy, microstructure analysis, electron microprobe analysis, high energy ion beam analysis, field ion microscopy, neutron diffraction, and small- angle scattering of X-rays and neutrons. Annotation copyright by Book News, Inc., Portland, OR

Includes bibliographical references and index.

Nanoscale characterization of surfaces and interfaces / N. J. DiNardo -- Mechanical spectroscopy / R. De Batist -- Scanning auger microscopy / M. A. Baker, J. E. Castle -- Quantitative acoustic microscopy / A. Briggs -- Quantitative description of microstructures by image analysis / H. E. Exner -- Electron microprobe analysis / E. Lifshin -- High energy ion beam analysis techniques / W.-K. Chu, J. Liu, Z. Zhang, K. B. Ma -- Field-Ion microscopy and atom probe analysis / A. Cerezo, G. D. W. Smith -- Neutron diffraction / R. B. Von Dreele -- Small-angle scattering of x-rays and neutrons / C. E. Williams, R. P. May, A. Guinier -- Characterization of surfaces, interfaces and thin films of organic materials / D. L. Allara, P. Zhang.

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