Statistical methods for SPC and TQM / Derek Bissell.
By: Bissell, Derek
.
Material type: 
BookSeries: Texts in statistical science: Publisher: London : Chapman & Hall, 1994Description: xii, 373 p. : ill ; 25 cm. + hbk.ISBN: 0412394405.Subject(s): Process control -- Statistical methods | Quality control -- Statistical methodsDDC classification: 658.562015195 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 658.562015195 (Browse shelf(Opens below)) | 1 | Available | 00010415 | ||
| General Lending | MTU Bishopstown Library Lending | 658.562015195 (Browse shelf(Opens below)) | 1 | Available | 00010548 |
Enhanced descriptions from Syndetics:
Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.
Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices
Includes bibliographical references (pages 341-343) and index.
Introduction -- Data collection and graphical summaries -- Numerical data summaries: location and dispersion -- Probability and distribution -- Sampling, estimation and confidence -- Simple tests of hypotheses: 'significance tests' -- Control charts for process management and improvement -- Control charts for average and variation -- Control charts for 'single-valued' observations -- Control charts for attributes and events -- Control charts: problems and special cases -- Cusum methods -- Process capability: attributes, events and normally distributed data -- Capability: non-normal distributions -- Evaluating the precision of a measurement system (gauge capability) -- Getting more from control chart data -- SPC in 'non-product' applications.