X-ray photoelectron spectroscopy of solid surfaces / Vadim I. Nefedov ; translated by N.G. Shartse.
By: Nefedov, V. I. (Vadim Ivanovich)
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Contributor(s): Shartse, N. G.
Material type:
BookPublisher: Utrecht : VSP, 1988Edition: 1st English ed.Description: vii, 191 p. : ill. ; 25 cm.ISBN: 9067640808.Subject(s): Electron spectroscopy | SolidsDDC classification: 539.26 | Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
|---|---|---|---|---|---|---|---|
| General Lending | MTU Bishopstown Library Lending | 539.26 (Browse shelf(Opens below)) | 1 | Available | 00030384 |
Enhanced descriptions from Syndetics:
This volume outlines the physical and methodical concepts of X-ray photoelectron spectroscopy (XPS) specifically for surface studies using both inner and valence electron levels. It discusses the theory and practice of XPS qualitative and quantitative analysis of solid state surfaces and provides lists of extended experimental and theoretical data necessary for the determination of concentration and thin film thicknesses. In addition it covers the many problems concerning in-depth profiling, ion sputtering rate and damages of the structure of altered layers, as well as applications of angular dependence of the intensities and photoelectron diffraction for surface studies. Also provided are the applications of XPS for the investigations of catalysts, adsorption, electronic surface states, oxydation of semi-conductors and alloys, minerals, including lunar regolith and natural gold, glasses, radiation damage, surface diffusion, polymers, etc.
Includes bibliographical references.
Binding energy of inner electrons and identification of chemical compounds -- Line intensity and quantitative analysis -- Ion sputtering and in depth analysis -- Study of adsorption and catalysts -- Studies of the surface and processes on the surface.