Semiconductor measurements and instrumentation / W. R. Runyan.
By: Runyan, W. R.
Material type: BookSeries: Texas Instruments electronics series.Publisher: New York : McGraw-Hill, [1975]Description: vii, 280 p. : ill. ; 26 cm. + hbk.ISBN: 0070542732.Subject(s): SemiconductorsDDC classification: 537.622Item type | Current library | Call number | Copy number | Status | Date due | Barcode | Item holds |
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General Lending | MTU Bishopstown Library Lending | 537.622 (Browse shelf(Opens below)) | 1 | Available | 00038161 |
Includes bibliographical references and index.
Crystal orientation -- Crystallographic defects and their observation -- Resistivity and carrier concentration measurements -- Lifetime -- Mobility, hall and type measurements -- Thickness measurements -- Preparation of samples for micrpscopic examination -- Microscopy and photography -- The electron microscope and other analytical instruments.