MTU Cork Library Catalogue

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Semiconductor measurements and instrumentation / W. R. Runyan.

By: Runyan, W. R.
Material type: materialTypeLabelBookSeries: Texas Instruments electronics series.Publisher: New York : McGraw-Hill, [1975]Description: vii, 280 p. : ill. ; 26 cm. + hbk.ISBN: 0070542732.Subject(s): SemiconductorsDDC classification: 537.622
Contents:
Crystal orientation -- Crystallographic defects and their observation -- Resistivity and carrier concentration measurements -- Lifetime -- Mobility, hall and type measurements -- Thickness measurements -- Preparation of samples for micrpscopic examination -- Microscopy and photography -- The electron microscope and other analytical instruments.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Lending 537.622 (Browse shelf(Opens below)) 1 Available 00038161
Total holds: 0

Includes bibliographical references and index.

Crystal orientation -- Crystallographic defects and their observation -- Resistivity and carrier concentration measurements -- Lifetime -- Mobility, hall and type measurements -- Thickness measurements -- Preparation of samples for micrpscopic examination -- Microscopy and photography -- The electron microscope and other analytical instruments.

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