MTU Cork Library Catalogue

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Introduction to scanning tunneling microscopy / Julian Chen.

By: Chen, C. Julian.
Material type: materialTypeLabelBookSeries: Oxford series in optical and imaging sciences: 4.Publisher: New York : Oxford University Press, 1993Description: xxii, 412 p., 31 p. of plates : ill. ; 24 cm. + hbk.ISBN: 0195071506.Subject(s): Scanning tunneling microscopyDDC classification: 502.82
Contents:
Overview -- Atom-scale tunneling -- Tunneling matrix elements -- Wave functions at surfaces -- Imaging crystalline surfaces -- Imaging atomic states -- Atomic forces and tunneling -- Tip-sample interactions -- Piezoelectric scanner -- Vibration isolation -- Electronics isolation -- Electronics and control -- Coarse positioner and STM design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy -- Illustrative applications.
Holdings
Item type Current library Call number Copy number Status Date due Barcode Item holds
General Lending MTU Bishopstown Library Store Item 502.82 (Browse shelf(Opens below)) 1 Available 00016038
Total holds: 0

Enhanced descriptions from Syndetics:

Due to its nondestructive imaging power, scanning tunneling microscopy has found major applications in the fields of physics, chemistry, engineering, and materials science. This book provides a comprehensive treatment of scanning tunneling and atomic force microscopy, with full coverage of the imaging mechanism, instrumentation, and sample applications. The work is the first single-author reference on STM and presents much valuable information previously available only as proceedings or collections of review articles. It contains a 32-page section of remarkable STM images, and is organized as a self-contained work, with all mathematical derivations fully detailed. As a source of background material and current data, the book will be an invaluable resource for all scientists, engineers, and technicians using the imaging abilities of STM and AFM. It may also be used as a textbook in senior-year and graduate level STM courses, and as a supplementary text in surface science, solid-state physics, materials science, microscopy, and quantum mechanics.

Includes bibliographical references (p. 383-404) and index..

Overview -- Atom-scale tunneling -- Tunneling matrix elements -- Wave functions at surfaces -- Imaging crystalline surfaces -- Imaging atomic states -- Atomic forces and tunneling -- Tip-sample interactions -- Piezoelectric scanner -- Vibration isolation -- Electronics isolation -- Electronics and control -- Coarse positioner and STM design -- Tip treatment -- Scanning tunneling spectroscopy -- Atomic force microscopy -- Illustrative applications.

Table of contents provided by Syndetics

  • 1 Overview
  • Part I Imaging Mechanism
  • 2 Atom-Scale Tunneling
  • 3 Tunneling Matrix Elements
  • 4 Wavefunctions at Surfaces
  • 5 Imaging Crystalline Surfaces
  • 6 Imaging Atomic States
  • 7 Atomic Forces and Tunneling
  • 8 Tip-Sample Interactions
  • Part II Instrumentation
  • 9 Piezoelectric Scanner
  • 10 Vibration Isolation
  • 11 Electronics and Control
  • 12 Coarse Positioner and SM Design
  • 13 Tip Treatment
  • 14 Scanning Tunneling Spectroscopy
  • 15 Atomic Force Microscopy
  • 16 Illustrative Examples

Author notes provided by Syndetics

C. Julian Chen is at IBM Thomas J. Watson Research Center.

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