Enhanced descriptions from Syndetics:

For undergraduate or postgraduate measurement labs, and for classes in advanced measurements or instrumentation, this highly acclaimed text provides an unusually in-depth, analytical treatment of measurement methods and systems.

Table of contents provided by Syndetics

• Preface (p. xiv)
• About the Author (p. v)
• Part 1 General Concepts (p. 1)
• Chapter 1 Types of Applications of Measurement Instrumentation (p. 3)
• 1.1 Why Study Measurement Systems? (p. 3)
• 1.2 Classification of Types of Measurement Applications (p. 5)
• 1.3 Computer-Aided Machines and Processes (p. 7)
• 1.4 Conclusion (p. 9)
• Problems (p. 10)
• Bibliography (p. 11)
• Chapter 2 Generalized Configurations and Functional Descriptions of Measuring Instruments (p. 13)
• 2.1 Functional Elements of an Instrument (p. 13)
• 2.2 Active and Passive Transducers (p. 18)
• 2.3 Analog and Digital Modes of Operation (p. 19)
• 2.4 Null and Deflection Methods (p. 21)
• 2.5 Input-Output Configuration of Instruments and Measurement Systems (p. 22)
• Methods of Correction for Interfering and Modifying Inputs (p. 26)
• 2.6 Conclusion (p. 38)
• Problems (p. 39)
• Chapter 3 Generalized Performance Characteristics of Instruments (p. 40)
• 3.1 Introduction (p. 40)
• 3.2 Static Characteristics and Static Calibration (p. 41)
• Meaning of Static Calibration (p. 41)
• Measured Value versus True Value (p. 43)
• Some Basic Statistics (p. 45)
• Least-Squares Calibration Curves (p. 54)
• Calibration Accuracy versus Installed Accuracy (p. 61)
• Combination of Component Errors in Overall System-Accuracy Calculations (p. 67)
• Theory Validation by Experimental Testing (p. 72)
• Effect of Measurement Error on Quality-Control Decisions in Manufacturing (p. 74)
• Static Sensitivity (p. 76)
• Computer-Aided Calibration and Measurement: Multiple Regression (p. 78)
• Linearity (p. 85)
• Threshold, Noise Floor, Resolution, Hysteresis, and Dead Space (p. 86)
• Scale Readability (p. 91)
• Span (p. 91)
• Generalized Static Stiffness and Input Impedance: Loading Effects (p. 91)
• Concluding Remarks on Static Characteristics (p. 103)
• 3.3 Dynamic Characteristics (p. 103)
• Generalized Mathematical Model of Measurement System (p. 103)
• Digital Simulation Methods for Dynamic Response Analysis (p. 106)
• Operational Transfer Function (p. 106)
• Sinusoidal Transfer Function (p. 107)
• Zero-Order Instrument (p. 109)
• First-Order Instrument (p. 111)
• Step Response of First-Order Instruments (p. 114)
• Ramp Response of First-Order Instruments (p. 121)
• Frequency Response of First-Order Instruments (p. 123)
• Impulse Response of First-Order Instruments (p. 128)
• Second-Order Instrument (p. 131)
• Step Response of Second-Order Instruments (p. 133)
• Terminated-Ramp Response of Second-Order Instruments (p. 135)
• Ramp Response of Second-Order Instruments (p. 137)
• Frequency Response of Second-Order Instruments (p. 137)
• Impulse Response of Second-Order Instruments (p. 139)
• Dead-Time Elements (p. 141)
• Logarithmic Plotting of Frequency-Response Curves (p. 143)
• Response of a General Form of Instrument to a Periodic Input (p. 149)
• Response of a General Form of Instrument to a Transient Input (p. 157)
• Frequency Spectra of Amplitude-Modulated Signals (p. 167)
• Characteristics of Random Signals (p. 178)
• Requirements on Instrument Transfer Function to Ensure Accurate Measurement (p. 194)
• Sensor Selection Using Computer Simulation (p. 200)
• Numerical Correction of Dynamic Data (p. 202)
• Experimental Determination of Measurement-System Parameters (p. 206)
• Loading Effects under Dynamic Conditions (p. 211)
• Problems (p. 214)
• Bibliography (p. 221)
• Part 2 Measuring Devices (p. 223)
• Chapter 4 Motion and Dimensional Measurement (p. 225)
• 4.1 Introduction (p. 225)
• 4.2 Fundamental Standards (p. 225)
• 4.3 Relative Displacement: Translational and Rotational (p. 228)
• Calibration (p. 228)
• Resistive Potentiometers (p. 231)
• Resistance Strain Gage (p. 240)
• Differential Transformers (p. 252)
• Synchros and Resolvers (p. 262)
• Variable-Inductance and Variable-Reluctance Pickups (p. 267)
• Eddy-Current Noncontacting Transducers (p. 271)
• Capacitance Pickups (p. 273)
• Piezoelectric Transducers (p. 284)
• Electro-Optical Devices (p. 292)
• Photographic and Electronic-Imaging Techniques (p. 312)
• Photoelastic, Brittle-Coating, and Moire Fringe Stress-Analysis Techniques (p. 319)
• Displacement-to-Pressure (Nozzle-Flapper) Transducer (p. 321)
• Digital Displacement Transducers (Translational and Rotary Encoders) (p. 327)
• Ultrasonic Transducers (p. 335)
• 4.4 Relative Velocity: Translational and Rotational (p. 337)
• Calibration (p. 337)
• Velocity by Electrical Differentiation of Displacement Voltage Signals (p. 339)
• Average Velocity from Measured [Delta]x and [Delta]t (p. 339)
• Mechanical Flyball Angular-Velocity Sensor (p. 342)
• Mechanical Revolution Counters and Timers (p. 342)
• Tachometer Encoder Methods (p. 343)
• Laser-Based Methods (p. 344)
• Radar (Microwave) Speed Sensors (p. 345)
• Stroboscopic Methods (p. 346)
• Translational-Velocity Transducers (Moving-Coil and Moving-Magnet Pickups) (p. 347)
• DC Tachometer Generators for Rotary-Velocity Measurement (p. 348)
• AC Tachometer Generators for Rotary-Velocity Measurement (p. 349)
• Eddy-Current Drag-Cup Tachometer (p. 349)
• 4.5 Relative-Acceleration Measurements (p. 351)
• 4.6 Seismic- (Absolute-) Displacement Pickups (p. 351)
• 4.7 Seismic- (Absolute-) Velocity Pickups (p. 356)
• 4.8 Seismic- (Absolute-) Acceleration Pickups (Accelerometers) (p. 357)
• Deflection-Type Accelerometers (p. 358)
• Null-Balance- (Servo-) Type Accelerometers (p. 369)
• Accelerometers for Inertial Navigation (p. 372)
• Mechanical Loading of Accelerometers on the Test Object (p. 373)
• Laser Doppler Vibrometers (p. 373)
• 4.9 Calibration of Vibration Pickups (p. 375)
• 4.10 Jerk Pickups (p. 378)
• 4.11 Pendulous (Gravity-Referenced) Angular-Displacement Sensors (p. 379)
• 4.12 Gyroscopic (Absolute) Angular-Displacement and Velocity Sensors (p. 383)
• 4.13 Coordinate-Measuring Machines (p. 398)
• 4.14 Surface-Finish Measurement (p. 406)
• 4.15 Machine Vision (p. 413)
• 4.16 The Global-Positioning System (GPS) (p. 421)
• Problems (p. 423)
• Bibliography (p. 431)
• Chapter 5 Force, Torque, and Shaft Power Measurement (p. 432)
• 5.1 Standards and Calibration (p. 432)
• 5.2 Basic Methods of Force Measurement (p. 434)
• 5.3 Characteristics of Elastic Force Transducers (p. 441)
• Bonded-Strain-Gage Transducers (p. 446)
• Differential-Transformer Transducers (p. 452)
• Piezoelectric Transducers (p. 452)
• Variable-Reluctance/FM-Oscillator Digital Systems (p. 455)
• Loading Effects (p. 456)
• 5.4 Resolution of Vector Forces and Moments into Rectangular Components (p. 457)
• 5.5 Torque Measurement on Rotating Shafts (p. 464)
• 5.6 Shaft Power Measurement (Dynamometers) (p. 470)
• 5.7 Gyroscopic Force and Torque Measurement (p. 474)
• 5.8 Vibrating-Wire Force Transducers (p. 474)
• Problems (p. 476)
• Bibliography (p. 480)
• Chapter 6 Pressure and Sound Measurement (p. 481)
• 6.1 Standards and Calibration (p. 481)
• 6.2 Basic Methods of Pressure Measurement (p. 482)
• 6.3 Deadweight Gages and Manometers (p. 482)
• Manometer Dynamics (p. 490)
• 6.4 Elastic Transducers (p. 500)
• 6.5 Vibrating-Cylinder and Other Resonant Transducers (p. 515)
• 6.6 Dynamic Effects of Volumes and Connecting Tubing (p. 517)
• Liquid Systems Heavily Damped, and Slow-Acting (p. 518)
• Liquid Systems Moderately Damped, and Fast-Acting (p. 520)
• Gas Systems with Tube Volume a Small Fraction of Chamber Volume (p. 524)
• Gas Systems with Tube Volume Comparable to Chamber Volume (p. 526)
• The Infinite Line-Pressure Probe (p. 527)
• Conclusion (p. 528)
• 6.7 Dynamic Testing of Pressure-Measuring Systems (p. 528)
• 6.8 High-Pressure Measurement (p. 535)
• 6.9 Low-Pressure (Vacuum) Measurement (p. 536)
• Diaphragm Gages (p. 536)
• McLeod Gage (p. 538)
• Knudsen Gage (p. 540)
• Momentum-Transfer (Viscosity) Gages (p. 541)
• Thermal-Conductivity Gages (p. 541)
• Ionization Gages (p. 545)
• Dual-Gage Technique (p. 547)
• 6.10 Sound Measurement (p. 547)
• Sound-Level Meter (p. 548)
• Microphones (p. 551)
• Pressure Response of a Capacitor Microphone (p. 554)
• Acoustic Intensity (p. 565)
• Acoustic Emission (p. 568)
• 6.11 Pressure-Signal Multiplexing Systems (p. 569)
• 6.12 Special Topics (p. 571)
• Pressure Distribution (p. 571)
• Overpressure Protection for Gages and Transducers (p. 573)
• Problems (p. 574)
• Bibliography (p. 576)
• Chapter 7 Flow Measurement (p. 578)
• 7.1 Local Flow Velocity, Magnitude and Direction (p. 578)
• Flow Visualization (p. 578)
• Velocity Magnitude from Pitot-Static Tube (p. 582)
• Velocity Direction from Yaw Tube, Pivoted Vane, and Servoed Sphere (p. 590)
• Dynamic Wind-Vector Indicator (p. 594)
• Hot-Wire and Hot-Film Anemometers (p. 596)
• Hot-Film Shock-Tube Velocity Sensors (p. 611)
• Laser Doppler Anemometer (p. 611)
• 7.2 Gross Volume Flow Rate (p. 615)
• Calibration and Standards (p. 616)
• Constant-Area, Variable-Pressure-Drop Meters ("Obstruction" Meters) (p. 620)
• Averaging Pitot Tubes (p. 632)
• Constant-Pressure-Drop, Variable-Area Meters (Rotameters) (p. 633)
• Turbine Meters (p. 635)
• Positive-Displacement Meters (p. 640)
• Metering Pumps (p. 642)
• Electromagnetic Flowmeters (p. 643)
• Drag-Force Flowmeters (p. 648)
• Ultrasonic Flowmeters (p. 649)
• Vortex-Shedding Flowmeters (p. 655)
• Miscellaneous Topics (p. 657)
• 7.2 Gross Mass Flow Rate (p. 660)
• Volume Flowmeter Plus Density Measurement (p. 660)
• Direct Mass Flowmeters (p. 664)
• Problems (p. 672)
• Bibliography (p. 675)
• Chapter 8 Temperature and Heat-Flux Measurement (p. 677)
• 8.1 Standards and Calibration (p. 677)
• 8.2 Thermal-Expansion Methods (p. 685)
• Bimetallic Thermometers (p. 685)
• Liquid-in-Glass Thermometers (p. 687)
• Pressure Thermometers (p. 688)
• 8.3 Thermoelectric Sensors (Thermocouples) (p. 691)
• Common Thermocouples (p. 699)
• Reference-Junction Considerations (p. 701)
• Special Materials, Configurations, and Techniques (p. 704)
• 8.4 Electrical-Resistance Sensors (p. 713)
• Conductive Sensors (Resistance Thermometers) (p. 713)
• Bulk Semiconductor Sensors (Thermistors) (p. 719)
• 8.5 Junction Semiconductor Sensors (p. 723)
• 8.6 Digital Thermometers (p. 727)
• 8.7 Radiation Methods (p. 727)
• Radiation Fundamentals (p. 728)
• Radiation Detectors: Thermal and Photon (p. 734)
• Unchopped (DC) Broadband Radiation Thermometers (p. 746)
• Chopped (AC) Broadband Radiation Thermometers (p. 750)
• Chopped (AC) Selective-Band (Photon) Radiation Thermometers (p. 752)
• Automatic Null-Balance Radiation Thermometers (p. 756)
• Monochromatic-Brightness Radiation Thermometers (Optical Pyrometers) (p. 758)
• Two-Color Radiation Thermometers (p. 760)
• Blackbody-Tipped Fiber-Optic Radiation Thermometer (p. 760)
• Fluoroptic Temperature Measurement (p. 763)
• Infrared Imaging Systems (p. 764)
• 8.8 Temperature-Measuring Problems in Flowing Fluids (p. 767)
• Conduction Error (p. 767)
• Radiation Error (p. 770)
• Velocity Effects (p. 774)
• 8.9 Dynamic Response of Temperature Sensors (p. 777)
• Dynamic Compensation of Temperature Sensors (p. 781)
• 8.10 Heat-Flux Sensors (p. 782)
• Slug-Type (Calorimeter) Sensors (p. 782)
• Steady-State or Asymptotic Sensors (Gardon Gage) (p. 786)
• Application Considerations (p. 788)
• Problems (p. 789)
• Bibliography (p. 791)
• Chapter 9 Miscellaneous Measurements (p. 792)
• 9.1 Time, Frequency, and Phase-Angle Measurement (p. 792)
• 9.2 Liquid Level (p. 799)
• 9.3 Humidity (p. 806)
• 9.4 Chemical Composition (p. 809)
• 9.5 Current and Power Measurement (p. 810)
• 9.6 Using "Observers" to Measure Inaccessible Variables in a Physical System (p. 814)
• 9.7 Sensor Fusion (Complementary Filtering) (p. 826)
• Absolute Angle Measurement (p. 829)
• Problems (p. 833)
• Bibliography (p. 834)
• Part 3 Manipulation, Transmission, and Recording of Data (p. 835)
• Chapter 10 Manipulating, Computing, and Compensating Devices (p. 837)
• 10.1 Bridge Circuits (p. 837)
• 10.2 Amplifiers (p. 843)
• Operational Amplifiers (p. 844)
• Instrumentation Amplifiers (p. 851)
• Transconductance and Transimpedance Amplifiers (p. 853)
• Noise Problems, Shielding, and Grounding (p. 855)
• Chopper, Chopper-Stabilized, and Carrier Amplifiers (p. 858)
• Charge Amplifiers and Impedance Converters (p. 860)
• Concluding Remarks (p. 863)
• 10.3 Filters (p. 864)
• Low-Pass Filters (p. 864)
• High-Pass Filters (p. 870)
• Bandpass Filters (p. 870)
• Band-Rejection Filters (p. 870)
• Digital Filters (p. 872)
• A Hydraulic Bandpass Filter for an Oceanographic Transducer (p. 875)
• Mechanical Filters for Accelerometers (p. 876)
• Filtering by Statistical Averaging (p. 879)
• 10.4 Integration and Differentiation (p. 879)
• Integration (p. 879)
• Differentiation (p. 881)
• 10.5 Dynamic Compensation (p. 889)
• 10.6 Positioning Systems (p. 894)
• 10.7 Addition and Subtraction (p. 904)
• 10.8 Multiplication and Division (p. 904)
• 10.9 Function Generation and Linearization (p. 907)
• 10.10 Amplitude Modulation and Demodulation (p. 912)
• 10.11 Voltage-to-Frequency and Frequency-to-Voltage Converters (p. 913)
• 10.12 Analog-to-Digital and Digital-to-Analog Converters; Sample/Hold Amplifiers (p. 913)
• 10.13 Signal and System Analyzers (Spectrum Analyzers) (p. 923)
• Problems (p. 927)
• Bibliography (p. 930)
• Chapter 11 Data Transmission and Instrument Connectivity (p. 931)
• 11.1 Cable Transmission of Analog Voltage and Current Signals (p. 931)
• 11.2 Cable Transmission of Digital Data (p. 935)
• 11.3 Fiber-Optic Data Transmission (p. 936)
• 11.4 Radio Telemetry (p. 937)
• 11.5 Pneumatic Transmission (p. 943)
• 11.6 Synchro Position Repeater Systems (p. 944)
• 11.7 Slip Rings and Rotary Transformers (p. 946)
• 11.8 Instrument Connectivity (p. 948)
• 11.9 Data Storage with Delayed Playback (An Alternative to Data Transmission) (p. 952)
• Problems (p. 952)
• Bibliography (p. 953)
• Chapter 12 Voltage-Indicating and -Recording Devices (p. 954)
• 12.1 Standards and Calibration (p. 954)
• 12.2 Analog Voltmeters and Potentiometers (p. 954)
• 12.3 Digital Voltmeters and Multimeters (p. 961)
• 12.4 Electromechanical Servotype XT and XY Recorders (p. 963)
• 12.5 Thermal-Array Recorders and Data Acquisition Systems (p. 968)
• 12.6 Analog and Digital Cathode-Ray Oscilloscopes/Displays and Liquid-Crystal Flat-Panel Displays (p. 968)
• 12.7 Virtual Instruments (p. 974)
• 12.8 Magnetic Tape and Disk Recorders/Reproducers (p. 974)
• Bibliography (p. 980)
• Chapter 13 Data-Acquisition Systems for Personal Computers (p. 981)
• 13.1 Essential Features of Data-Acquisition Boards (p. 982)
• 13.2 The DASYLAB Data-Acquisition and -Processing Software (p. 983)
• The DASYLAB Functional Modules (p. 984)
• List and Brief Description of the Functional Modules (p. 985)
• 13.3 DASYLAB Simulation Example Number One (p. 988)
• Simulating Sensor Signals and Recording Them versus Time (p. 988)
• Stopping an Experiment at a Selected Time (p. 991)
• Chart Recorder Options (p. 991)
• Producing Tables or Lists (p. 991)
• Analog and Digital Meters (p. 992)
• Some Simple Data-Processing Operations (p. 992)
• Integration and Differentiation (p. 993)
• 13.4 DASYLAB Simulation Example Number Two (p. 993)
• Running the Demonstration (p. 997)
• 13.5 DASYLAB Simulation Example Number Three (p. 1000)
• Running the Demonstration (p. 1003)
• 13.6 A Simple Real-World Experiment Using DASYLAB (p. 1005)
• Chapter 14 Measurement Systems Applied to Micro- and Nanotechnology (p. 1015)
• 14.1 Microscale Sensors (p. 1016)
• 14.2 Micro-Motion-Positioning Systems (p. 1019)
• 14.3 Particle Instruments and Clean-Room Technology (p. 1028)
• 14.4 Partial-Pressure Measurements in Vacuum Processes (p. 1038)
• 14.5 Magnetic Levitation Systems for Wafer Conveyors (p. 1048)
• 14.6 Scanning-Probe Microscopes (p. 1055)
• Bibliography (p. 1062)
• Index (p. 1063)

Author notes provided by Syndetics