Entry Topical Term

Number of records used in: 3

001 - CONTROL NUMBER

• control field: 45617

010 ## - LIBRARY OF CONGRESS CONTROL NUMBER

• LC control number: sh 94008704

003 - CONTROL NUMBER IDENTIFIER

• control field: DLC

005 - DATE AND TIME OF LATEST TRANSACTION

• control field: 20171120153912.0

008 - FIXED-LENGTH DATA ELEMENTS

• fixed length control field: 941118i| anannbab| |a ana |||

010 ## - LIBRARY OF CONGRESS CONTROL NUMBER

• LC control number: sh 94008704

040 ## - CATALOGING SOURCE

• Original cataloging agency: DLC
• Transcribing agency: DLC
• Modifying agency: DLC

053 #0 - LC CLASSIFICATION NUMBER

• Classification number element--single number or beginning number of span: QH212.A78

150 ## - HEADING--TOPICAL TERM

• Topical term or geographic name entry element: Atomic force microscopy

450 ## - SEE FROM TRACING--TOPICAL TERM

• Topical term or geographic name entry element: AFM (Microscopy)

550 ## - SEE ALSO FROM TRACING--TOPICAL TERM

• Control subfield: g
• Topical term or geographic name entry element: Scanning probe microscopy

670 ## - SOURCE DATA FOUND

• Source citation: Work cat.: 94-42035: Selected papers on scanning probe microscopes, c1995:
• Information found: CIP galley (Atomic force microscopy; AFM)

670 ## - SOURCE DATA FOUND

• Source citation: ASTI, v. 1993
• Information found: (Atomic force microscopy)

670 ## - SOURCE DATA FOUND

• Source citation: Encyc. phys. sci tech.:
• Information found: v. 10, p. 415 (advent of the scanning tunneling microscope and the atomic force microscope, which allow imaging of single atoms and molecules, is providing renewed excitement in the field of molecular electronics)

670 ## - SOURCE DATA FOUND

• Source citation: INSPEC
• Information found: (Atomic force microscopy)

670 ## - SOURCE DATA FOUND

• Source citation: MESH
• Information found: (Microscopy, Atomic force)