Normal view
MARC view
Entry Topical Term
001 - CONTROL NUMBER
- control field: 44685
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
- LC control number: sh 88004761
003 - CONTROL NUMBER IDENTIFIER
- control field: DLC
005 - DATE AND TIME OF LATEST TRANSACTION
- control field: 20171120153905.0
008 - FIXED-LENGTH DATA ELEMENTS
- fixed length control field: 880803i| anannbab| |a ana |||
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER
- LC control number: sh 88004761
040 ## - CATALOGING SOURCE
- Original cataloging agency: DLC
- Transcribing agency: DLC
- Modifying agency: DLC
053 #0 - LC CLASSIFICATION NUMBER
- Classification number element--single number or beginning number of span: QH212.S35
150 ## - HEADING--TOPICAL TERM
- Topical term or geographic name entry element: Scanning tunneling microscopy
450 ## - SEE FROM TRACING--TOPICAL TERM
- Topical term or geographic name entry element: STM (Microscopy)
550 ## - SEE ALSO FROM TRACING--TOPICAL TERM
- Control subfield: g
- Topical term or geographic name entry element: Scanning probe microscopy
670 ## - SOURCE DATA FOUND
- Source citation: Work cat.: International Conference on Scanning Tunneling Microscopy (1st : 1986: Santiago de Compostela, Spain). STM '86 : proceedings ... 1987
- Information found: (STM)
670 ## - SOURCE DATA FOUND
- Source citation: Encyc. phys. sci. tech.:
- Information found: v. 13, p. 530+ (Using tunnel effect, images surface topographies on an atomic scale)
670 ## - SOURCE DATA FOUND
- Source citation: INSPEC
- Information found: (Scanning tunnelling microscopy)
670 ## - SOURCE DATA FOUND
- Source citation: ASTI, v. 1986:
- Information found: p. 2458, under Tunneling microscopes and microscopy (Scanning tunneling microscopy of surface microstructure)
670 ## - SOURCE DATA FOUND
- Source citation: MESH
- Information found: (Microscopy, Scanning Tunneling)
675 ## - SOURCE DATA NOT FOUND
- Source citation: LC data base, 7/27/87;
- Source citation: INIS: Thes.;
- Source citation: NASA;
- Source citation: Encyc. physics;
- Source citation: McGraw-Hill dict. sci. tech.;
- Source citation: Engr. index