MARC details
000 -LEADER |
fixed length control field |
01727 am a2200349 a 4500 |
001 - CONTROL NUMBER |
control field |
ocm0780342682 |
008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
fixed length control field |
971008s1998 nyua b 101 eng |
010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
LC control number |
97044564 |
020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
International Standard Book Number |
0780342682 |
029 ## - OTHER SYSTEM CONTROL NUMBER (OCLC) |
OCLC library identifier |
T24636 |
040 ## - CATALOGING SOURCE |
Modifying agency |
OCoLC |
082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
Classification number |
620.0044 |
245 00 - TITLE STATEMENT |
Title |
Instrumentation and measurement technology and applications / |
Statement of responsibility, etc. |
edited by Emil M. Petriu. |
260 ## - PUBLICATION, DISTRIBUTION, ETC. |
Place of publication, distribution, etc. |
New York : |
Name of publisher, distributor, etc. |
Institute of Electrical and Electronics Engineers, |
Date of publication, distribution, etc. |
1998. |
300 ## - PHYSICAL DESCRIPTION |
Extent |
xx, 521 p. : |
Other physical details |
ill. ; |
Dimensions |
29 cm. + |
Accompanying material |
hbk. |
490 1# - SERIES STATEMENT |
Series statement |
IEEE Technology Update Series |
500 ## - GENERAL NOTE |
General note |
A collection of selected papers from recent IEEE conferences. |
504 ## - BIBLIOGRAPHY, ETC. NOTE |
Bibliography, etc. note |
Includes bibliographical references and index. |
505 0# - FORMATTED CONTENTS NOTE |
Formatted contents note |
Part I: Technology -- Measurement theory and system characterization -- Metrology, standards and calibration -- Quantization and A/D conversion -- Basic measurements -- High frequency and dielectric measurements -- Electro-optic measurements -- Sensors and their interfaces -- Smart sensor integration technologies -- Data acquisition and computer based measurement systems -- -- Signal processing -- Image processing -- Part II: Applications -- Miscellaneous applications -- Integrated circuit testing -- Soft computing and virtual environment-based applications. |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Electronic instruments |
9 (RLIN) |
36736 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Measurement |
9 (RLIN) |
61329 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Optoelectronics. |
9 (RLIN) |
40627 |
650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
Topical term or geographic name entry element |
Detectors. |
9 (RLIN) |
36190 |
700 1# - ADDED ENTRY--PERSONAL NAME |
Personal name |
Petriu, Emil. |
9 (RLIN) |
21580 |
830 #0 - SERIES ADDED ENTRY--UNIFORM TITLE |
Uniform title |
IEEE technology update series. |
9 (RLIN) |
30847 |
907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
a |
.b10134396 |
b |
140116 |
c |
011116 |
942 ## - ADDED ENTRY ELEMENTS (KOHA) |
Suppress in OPAC |
0 |
-- |
|
-- |
CRON CRON |
969 00 - LOCAL CODES |
a |
47477 |
979 00 - LOCAL CODES |
a |
FQ |
b |
15 APR 1999 |
989 00 - LOCAL CODES |
a |
FQ |
b |
23 MAY 2000 |
998 ## - LOCAL CONTROL INFORMATION (RLIN) |
a |
c |
Operator's initials, OID (RLIN) |
011115 |
Cataloger's initials, CIN (RLIN) |
m |
First Date, FD (RLIN) |
a |
Local |
- |
-- |
eng |
-- |
nyu |
h |
0 |