MARC details
| 000 -LEADER |
|---|
| fixed length control field |
01525 am a2200409 a 4500 |
| 001 - CONTROL NUMBER |
|---|
| control field |
ocm0412477904 |
| 008 - FIXED-LENGTH DATA ELEMENTS--GENERAL INFORMATION |
|---|
| fixed length control field |
930819s1994 enka rb 001 eng |
| 010 ## - LIBRARY OF CONGRESS CONTROL NUMBER |
|---|
| LC control number |
93032187 |
| 020 ## - INTERNATIONAL STANDARD BOOK NUMBER |
|---|
| International Standard Book Number |
0412477904 (acidfree paper) |
| 029 ## - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
T15970 |
| 029 ## - OTHER SYSTEM CONTROL NUMBER (OCLC) |
|---|
| OCLC library identifier |
T33509 |
| 040 ## - CATALOGING SOURCE |
|---|
| Modifying agency |
OCoLC |
| 082 04 - DEWEY DECIMAL CLASSIFICATION NUMBER |
|---|
| Classification number |
620.112 |
| 100 1# - MAIN ENTRY--PERSONAL NAME |
|---|
| Personal name |
Loretto, M. H. |
| 9 (RLIN) |
13227 |
| 245 10 - TITLE STATEMENT |
|---|
| Title |
Electron beam analysis of materials / |
| Statement of responsibility, etc. |
M.H. Loretto. |
| 250 ## - EDITION STATEMENT |
|---|
| Edition statement |
2nd ed. |
| 260 ## - PUBLICATION, DISTRIBUTION, ETC. |
|---|
| Place of publication, distribution, etc. |
London ; |
| -- |
New York : |
| Name of publisher, distributor, etc. |
Chapman & Hall, |
| Date of publication, distribution, etc. |
1994. |
| 300 ## - PHYSICAL DESCRIPTION |
|---|
| Extent |
vi, 272 p. : |
| Other physical details |
ill. ; |
| Dimensions |
24 cm. + |
| Accompanying material |
pbk. |
| 504 ## - BIBLIOGRAPHY, ETC. NOTE |
|---|
| Bibliography, etc. note |
Includes bibliographical references and index. |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Materials |
| General subdivision |
Analysis. |
| 9 (RLIN) |
39620 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron beams |
| General subdivision |
Industrial applications. |
| 9 (RLIN) |
36691 |
| 650 #0 - SUBJECT ADDED ENTRY--TOPICAL TERM |
|---|
| Topical term or geographic name entry element |
Electron microscopy. |
| 9 (RLIN) |
36693 |
| 907 ## - LOCAL DATA ELEMENT G, LDG (RLIN) |
|---|
| a |
.b10044814 |
| b |
050428 |
| c |
011116 |
| 942 ## - ADDED ENTRY ELEMENTS (KOHA) |
|---|
| Suppress in OPAC |
0 |
| 969 00 - LOCAL CODES |
|---|
| a |
28315 |
| 970 01 - Local field |
|---|
| t |
Contents |
| 970 11 - Local field |
|---|
| l |
1 |
| t |
Introduction to Electron Beam Instruments |
| p |
1 |
| 970 11 - Local field |
|---|
| l |
2 |
| t |
Electron-Specimen Interactions |
| p |
21 |
| 970 11 - Local field |
|---|
| l |
3 |
| t |
Layout and Operational Modes of Electron Beam Instruments |
| p |
43 |
| 970 11 - Local field |
|---|
| l |
4 |
| t |
Interpretation of Diffraction Information |
| p |
85 |
| 970 11 - Local field |
|---|
| l |
5 |
| t |
Analysis of Micrographs in TEM, STEM, HREM and SEM |
| p |
143 |
| 970 11 - Local field |
|---|
| l |
6 |
| t |
Interpretation of Analytical Data |
| p |
197 |
| 979 00 - LOCAL CODES |
|---|
| a |
OB2 |
| b |
01 NOV 2001 |
| 989 00 - LOCAL CODES |
|---|
| a |
OB2 |
| 998 ## - LOCAL CONTROL INFORMATION (RLIN) |
|---|
| a |
c |
| Operator's initials, OID (RLIN) |
011115 |
| Cataloger's initials, CIN (RLIN) |
m |
| First Date, FD (RLIN) |
a |
| Local |
- |
| -- |
eng |
| -- |
enk |
| h |
0 |