Advanced scanning electron microscopy and X-ray microanalysis /
Advanced scanning electron microscopy and X-ray microanalysis /
edited by Dale E. Newbury ... [et al.].
- New York : Plenum Press, 1986.
- xii, 454 p. : ill. (some col.) ; 24 cm.
Includes bibliographical references (pages 435-448) and index.
Modeling electron beam-specimen interactions -- SEM microcharacterization of semiconductors -- Electron channeling contrast in the SEM -- Magnetic contrast in the SEM -- Computer-aided imaging and interpretation -- Alternative microanalytical techniques -- Specimen coating -- Advances in specimen preparation for biological SEM -- Cryomicroscopy.
0306421402
85028261
Scanning electron microscopy.
X-ray microanalysis.
Electron probe microanalysis.
502.825
Includes bibliographical references (pages 435-448) and index.
Modeling electron beam-specimen interactions -- SEM microcharacterization of semiconductors -- Electron channeling contrast in the SEM -- Magnetic contrast in the SEM -- Computer-aided imaging and interpretation -- Alternative microanalytical techniques -- Specimen coating -- Advances in specimen preparation for biological SEM -- Cryomicroscopy.
0306421402
85028261
Scanning electron microscopy.
X-ray microanalysis.
Electron probe microanalysis.
502.825