Microscale and nanoscale testing of materials using scanning probe technologies /
Phelan, Mark.
Microscale and nanoscale testing of materials using scanning probe technologies / Mark Phelan. - Cork : CIT, 1998. - iv, 151 p. various pagings : ill (some col.) ; 30 cm. + hbk. - M.Sc. - Applied Physics and Instrumentation .
Thesis (M.Sc.) - Cork Institute of Technology, 1998.
Bibliography: p. 142-151.
Scanning probe microscopy.
Scanning tunneling microscopy.
THESES PRESS
Microscale and nanoscale testing of materials using scanning probe technologies / Mark Phelan. - Cork : CIT, 1998. - iv, 151 p. various pagings : ill (some col.) ; 30 cm. + hbk. - M.Sc. - Applied Physics and Instrumentation .
Thesis (M.Sc.) - Cork Institute of Technology, 1998.
Bibliography: p. 142-151.
Scanning probe microscopy.
Scanning tunneling microscopy.
THESES PRESS